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Masaru Inoue
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Mito, JP
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last 30 patents
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Patent Grant
Obtaining a spectrogram from a single scanning of interference fringes
Patent number
5,253,183
Issue date
Oct 12, 1993
Hitachi, Ltd.
Masaru Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Polarization interferometer
Patent number
4,732,481
Issue date
Mar 22, 1988
Hitachi, Ltd.
Shigeru Matsui
G01 - MEASURING TESTING
Information
Patent Grant
Double beam interferometer using refractive scanning method
Patent number
4,585,345
Issue date
Apr 29, 1986
Hitachi, Ltd.
Masaru Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Spectrophotometer
Patent number
4,169,678
Issue date
Oct 2, 1979
Hitachi, Ltd.
Masaru Inoue
G01 - MEASURING TESTING