Masaru Matsushima

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Adhesive sheet
- Patent number 10,233,361
- Issue date Mar 19, 2019
- Lintec Corporation
- Kiichiro Kato
- C08 - ORGANIC MACROMOLECULAR COMPOUNDS THEIR PREPARATION OR CHEMICAL WORKING-...
Information Patent Grant
Adhesive sheet
- Patent number 10,221,338
- Issue date Mar 5, 2019
- Lintec Corporation
- Kazue Uemura
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Apparatus and method for processing sample, and charged particle ra...
- Patent number 9,666,408
- Issue date May 30, 2017
- Hitachi High-Technologies Corporation
- Shuichi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement or inspecting apparatus
- Patent number 8,921,781
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device and soundproof cover
- Patent number 8,835,883
- Issue date Sep 16, 2014
- Hitachi High-Technologies Corporation
- Daisuke Muto
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Charged particle beam apparatus having noise absorbing arrangements
- Patent number 8,822,952
- Issue date Sep 2, 2014
- Hitachi High-Technologies Corporation
- Daisuke Muto
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Stage device
- Patent number 8,823,309
- Issue date Sep 2, 2014
- Hitachi High-Technologies Corporation
- Hironori Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope, and specimen holding method
- Patent number 8,680,466
- Issue date Mar 25, 2014
- Hitachi High-Technologies Coporation
- Seiichiro Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and evaluation method using the charge...
- Patent number 8,653,455
- Issue date Feb 18, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Kitsunai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,653,459
- Issue date Feb 18, 2014
- Hitachi High-Technologies Corporation
- Seiichiro Kanno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspecting apparatus
- Patent number 8,519,332
- Issue date Aug 27, 2013
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspecting apparatus
- Patent number 8,232,522
- Issue date Jul 31, 2012
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen stage apparatus and specimen stage positioning control method
- Patent number 8,076,651
- Issue date Dec 13, 2011
- Hitachi High-Technologies Corporation
- Masahiro Koyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and specimen stage positioning control method f...
- Patent number 7,435,974
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Masaru Matsushima
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20240177963
- Publication date May 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuki UCHIOKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADHESIVE SHEET
- Publication number 20170183544
- Publication date Jun 29, 2017
- Lintec Corporation
- Kiichiro KATO
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
ADHESIVE SHEET
- Publication number 20170174946
- Publication date Jun 22, 2017
- Lintec Corporation
- Kazue UEMURA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
ADHESIVE SHEET
- Publication number 20170174943
- Publication date Jun 22, 2017
- Lintec Corporation
- Kiichiro KATO
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Apparatus and Method for Processing Sample, and Charged Particle Ra...
- Publication number 20150340198
- Publication date Nov 26, 2015
- Hitachi High-Technologies Corporation
- Shuichi NAKAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTING APPARATUS
- Publication number 20130327939
- Publication date Dec 12, 2013
- Hitachi High-Technologies
- Go MIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130228686
- Publication date Sep 5, 2013
- Daisuke Muto
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
CHARGED PARTICLE RADIATION DEVICE AND SOUNDPROOF COVER
- Publication number 20130082194
- Publication date Apr 4, 2013
- Daisuke Muto
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Application
SEMICONDUCTOR INSPECTING APPARATUS
- Publication number 20120261589
- Publication date Oct 18, 2012
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20120256087
- Publication date Oct 11, 2012
- Hitachi High-Technologies Corporation
- Seiichiro Kanno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stage Device
- Publication number 20120145920
- Publication date Jun 14, 2012
- Hitachi High-Technologies Corporation
- Hironori Ogawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND EVALUATION METHOD USING THE CHARGE...
- Publication number 20120070066
- Publication date Mar 22, 2012
- Hitachi High-Technologies Corporation
- Hiroyuki Kitsunai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROTECTIVE SHEET FOR SOLAR CELL MODULE, AND SOLAR CELL MODULE USING...
- Publication number 20120006401
- Publication date Jan 12, 2012
- Mitsubishi Plastics, Inc.
- Yasunari Takanashi
- B32 - LAYERED PRODUCTS
Information Patent Application
ELECTRON MICROSCOPE, AND SPECIMEN HOLDING METHOD
- Publication number 20110303844
- Publication date Dec 15, 2011
- Hitachi High-Technologies Corporation
- Seiichiro Kanno
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTING APPARATUS
- Publication number 20110095185
- Publication date Apr 28, 2011
- Hitachi High-Technologies Corporation
- Go Miya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN STAGE APPARATUS AND SPECIMEN STAGE POSITIONING CONTROL METHOD
- Publication number 20090250625
- Publication date Oct 8, 2009
- Masahiro KOYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope and specimen stage positioning control method f...
- Publication number 20070057196
- Publication date Mar 15, 2007
- Hitachi High-Technologies Corporation
- Masaru Matsushima
- H01 - BASIC ELECTRIC ELEMENTS

Masaru Matsushima

Person

Patents Grantslast 30 patents

Adhesive sheet

Adhesive sheet

Apparatus and method for processing sample, and charged particle ra...

Measurement or inspecting apparatus

Charged particle radiation device and soundproof cover

Charged particle beam apparatus having noise absorbing arrangements

Stage device

Electron microscope, and specimen holding method

Charged particle beam device and evaluation method using the charge...

Scanning electron microscope

Semiconductor inspecting apparatus

Semiconductor inspecting apparatus

Specimen stage apparatus and specimen stage positioning control method

Electron microscope and specimen stage positioning control method f...

Patents Applicationslast 30 patents

Charged Particle Beam Apparatus

ADHESIVE SHEET

ADHESIVE SHEET

ADHESIVE SHEET

Apparatus and Method for Processing Sample, and Charged Particle Ra...

SEMICONDUCTOR INSPECTING APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE RADIATION DEVICE AND SOUNDPROOF COVER

SEMICONDUCTOR INSPECTING APPARATUS

Scanning Electron Microscope

Stage Device

CHARGED PARTICLE BEAM DEVICE AND EVALUATION METHOD USING THE CHARGE...

PROTECTIVE SHEET FOR SOLAR CELL MODULE, AND SOLAR CELL MODULE USING...

ELECTRON MICROSCOPE, AND SPECIMEN HOLDING METHOD

SEMICONDUCTOR INSPECTING APPARATUS

SPECIMEN STAGE APPARATUS AND SPECIMEN STAGE POSITIONING CONTROL METHOD

Electron microscope and specimen stage positioning control method f...