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Masaru NISHIGUCHI

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  • Hirakata, Osaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Ion analyzer
    • Patent number 12,100,582
    • Issue date Sep 24, 2024
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometry device and mass spectrometry method
    • Patent number 11,874,257
    • Issue date Jan 16, 2024
    • Shimadzu Corporation
    • Ryo Kageyama
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 11,848,184
    • Issue date Dec 19, 2023
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ionizer and mass spectrometer
    • Patent number 11,495,447
    • Issue date Nov 8, 2022
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Quadrupole mass spectrometer
    • Patent number 11,437,227
    • Issue date Sep 6, 2022
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Quadrupole mass spectrometer
    • Patent number 11,430,650
    • Issue date Aug 30, 2022
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion detection device and mass spectrometer
    • Patent number 11,348,779
    • Issue date May 31, 2022
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometry device and ion detection device
    • Patent number 10,546,740
    • Issue date Jan 28, 2020
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer and ion mobility spectrometer
    • Patent number 10,281,433
    • Issue date May 7, 2019
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 10,229,823
    • Issue date Mar 12, 2019
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion mobility analyzer and mass spectrometer
    • Patent number 9,874,543
    • Issue date Jan 23, 2018
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion transport apparatus and mass spectrometer using the same
    • Patent number 9,773,656
    • Issue date Sep 26, 2017
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion transport apparatus and mass spectrometer using the same
    • Patent number 9,601,323
    • Issue date Mar 21, 2017
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Time-of-flight mass spectrometer
    • Patent number 9,373,490
    • Issue date Jun 21, 2016
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle analyzer
    • Patent number 8,680,479
    • Issue date Mar 25, 2014
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Time-of-flight mass spectrometer
    • Patent number 8,664,592
    • Issue date Mar 4, 2014
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,658,969
    • Issue date Feb 25, 2014
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass analysis method and mass analysis system
    • Patent number 8,164,054
    • Issue date Apr 24, 2012
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,134,123
    • Issue date Mar 13, 2012
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,026,480
    • Issue date Sep 27, 2011
    • Shimadzu Corporation
    • Shinichi Yamaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,013,292
    • Issue date Sep 6, 2011
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,928,372
    • Issue date Apr 19, 2011
    • Shimadzu Corporation
    • Shinichi Yamaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,763,847
    • Issue date Jul 27, 2010
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    METHOD FOR DRIVING LINEAR ION TRAP AND MASS SPECTROMETER
    • Publication number 20240087874
    • Publication date Mar 14, 2024
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20240079224
    • Publication date Mar 7, 2024
    • Shimadzu Corporation
    • Shinichiro Okamura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20230245878
    • Publication date Aug 3, 2023
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20230215719
    • Publication date Jul 6, 2023
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION ANALYZER
    • Publication number 20230059144
    • Publication date Feb 23, 2023
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION ANALYZER
    • Publication number 20220375739
    • Publication date Nov 24, 2022
    • Shimadzu Corporation
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20220293408
    • Publication date Sep 15, 2022
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD
    • Publication number 20220128529
    • Publication date Apr 28, 2022
    • SHIMADZU CORPORATION
    • Ryo KAGEYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    IONIZER AND MASS SPECTROMETER
    • Publication number 20210375609
    • Publication date Dec 2, 2021
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    QUADRUPOLE MASS SPECTROMETER
    • Publication number 20210351028
    • Publication date Nov 11, 2021
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    QUADRUPOLE MASS SPECTROMETER
    • Publication number 20210183638
    • Publication date Jun 17, 2021
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION DETECTION DEVICE AND MASS SPECTROMETER
    • Publication number 20200035474
    • Publication date Jan 30, 2020
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETRY DEVICE AND ION DETECTION DEVICE
    • Publication number 20190252178
    • Publication date Aug 15, 2019
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20180315588
    • Publication date Nov 1, 2018
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER AND ION MOBILITY SPECTROMETER
    • Publication number 20180011057
    • Publication date Jan 11, 2018
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ION TRANSPORT APPARATUS AND MASS SPECTROMETER USING THE SAME
    • Publication number 20170148620
    • Publication date May 25, 2017
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ION MOBILITY ANALYZER AND MASS SPECTROMETER
    • Publication number 20160327516
    • Publication date Nov 10, 2016
    • Shimadzu Corporation
    • Masaru NISHIGUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ION TRANSPORT APPARATUS AND MASS SPECTROMETER USING THE SAME
    • Publication number 20160189946
    • Publication date Jun 30, 2016
    • SHIMADZU CORPORATION
    • Masaru NISHIGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Time-Of-Flight Mass Spectrometer
    • Publication number 20130168547
    • Publication date Jul 4, 2013
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE ANALYZER
    • Publication number 20110174968
    • Publication date Jul 21, 2011
    • SHIMADZU CORPORATION
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass Spectrometer
    • Publication number 20110012017
    • Publication date Jan 20, 2011
    • SHIMADZU CORPORATION
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS ANALYSIS METHOD AND MASS ANALYSIS SYSTEM
    • Publication number 20100282965
    • Publication date Nov 11, 2010
    • SHIMADZU CORPORATION
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20100148061
    • Publication date Jun 17, 2010
    • Shimadzu Corporation
    • Shinichi Yamaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20100140469
    • Publication date Jun 10, 2010
    • SHIMADZU CORPORATION
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20100116979
    • Publication date May 13, 2010
    • Shimadazu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20080210862
    • Publication date Sep 4, 2008
    • SHIMADZU CORPORATION
    • Shinichi YAMAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20080197276
    • Publication date Aug 21, 2008
    • Shimadzu Corporation
    • Masaru Nishiguchi
    • H01 - BASIC ELECTRIC ELEMENTS