Masaru Sanada

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Information protection apparatus, information protection method and...
- Patent number 11,977,648
- Issue date May 7, 2024
- Nippon Telegraph and Telephone Corporation
- Masaru Sanada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
LSI diagnostic system and method of diagnosing LSI
- Patent number 6,883,115
- Issue date Apr 19, 2005
- NEC Electronics Corporation
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Grant
Internal-logic inspection circuit
- Patent number 6,285,040
- Issue date Sep 4, 2001
- NEC Corporation
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Grant
Method of locating faults in LSI
- Patent number 6,173,426
- Issue date Jan 9, 2001
- NEC Corporation
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit having a logic verifying structure...
- Patent number 6,144,084
- Issue date Nov 7, 2000
- NEC Corporation
- Masaru Sanada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing process diagnosis system suitabl...
- Patent number 6,136,618
- Issue date Oct 24, 2000
- NEC Corporation
- Masaru Sanada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adsorption type cooling apparatus, method of controlling cold outpu...
- Patent number 6,041,617
- Issue date Mar 28, 2000
- Mayekawa Mfg. Co., Ltd.
- Masaru Sanada
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Method and system for identifying failure point
- Patent number 5,944,847
- Issue date Aug 31, 1999
- Tokyo, Japan
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Grant
Fault point estimating system using abnormal current and potential...
- Patent number 5,943,346
- Issue date Aug 24, 1999
- NEC Corporation
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Grant
Fault mode estimating system using abnormal current and V-I charact...
- Patent number 5,889,789
- Issue date Mar 30, 1999
- NEC Coporation
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Grant
Fault block detecting system using abnormal current and abnormal da...
- Patent number 5,864,566
- Issue date Jan 26, 1999
- NEC Corporation
- Masaru Sanada
- G11 - INFORMATION STORAGE
Information Patent Grant
Fault block detecting system using abnormal current
- Patent number 5,850,404
- Issue date Dec 15, 1998
- NEC Corporation
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Grant
Adsorption type cooling apparatus, method of controlling cold outpu...
- Patent number 5,732,569
- Issue date Mar 31, 1998
- Mayekawa Mfg. Co., Ltd.
- Masaru Sanada
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Method and apparatus for detecting short circuit point between wiri...
- Patent number 5,640,099
- Issue date Jun 17, 1997
- NEC Corporation
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device analyzable by using laser b...
- Patent number 5,329,139
- Issue date Jul 12, 1994
- NEC Corporation
- Masaru Sanada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROTECTION APPARATUS, INFORMATION PROTECTION METHOD AND...
- Publication number 20220215105
- Publication date Jul 7, 2022
- Nippon Telegraph and Telephone Corporation
- Masaru Sanada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CAUTION-NEEDED IP ADDRESS ESTIMATION APPARATUS, MONITORING SYSTEM,...
- Publication number 20220201028
- Publication date Jun 23, 2022
- Nippon Telegraph and Telephone Corporation
- Masaru Sanada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Wafer testing apparatus
- Publication number 20030218474
- Publication date Nov 27, 2003
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Application
LSI diagnostic system and method of diagnosing LSI
- Publication number 20030057991
- Publication date Mar 27, 2003
- NEC Corporation
- Masaru Sanada
- G01 - MEASURING TESTING
Information Patent Application
Method for processing formation and sale of merchandise by means of...
- Publication number 20020002484
- Publication date Jan 3, 2002
- NEC Corporation
- Masaru Sanada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Performer collection for promotion video through internet and produ...
- Publication number 20010056373
- Publication date Dec 27, 2001
- NEC Corporation
- Masaru Sanada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Logic determination device for semiconductor integrated device and...
- Publication number 20010050936
- Publication date Dec 13, 2001
- Masaru Sanada
- G01 - MEASURING TESTING

Masaru Sanada

Person

Patents Grantslast 30 patents

Information protection apparatus, information protection method and...

LSI diagnostic system and method of diagnosing LSI

Internal-logic inspection circuit

Method of locating faults in LSI

Semiconductor integrated circuit having a logic verifying structure...

Semiconductor device manufacturing process diagnosis system suitabl...

Adsorption type cooling apparatus, method of controlling cold outpu...

Method and system for identifying failure point

Fault point estimating system using abnormal current and potential...

Fault mode estimating system using abnormal current and V-I charact...

Fault block detecting system using abnormal current and abnormal da...

Fault block detecting system using abnormal current

Adsorption type cooling apparatus, method of controlling cold outpu...

Method and apparatus for detecting short circuit point between wiri...

Semiconductor integrated circuit device analyzable by using laser b...

Patents Applicationslast 30 patents

INFORMATION PROTECTION APPARATUS, INFORMATION PROTECTION METHOD AND...

CAUTION-NEEDED IP ADDRESS ESTIMATION APPARATUS, MONITORING SYSTEM,...

Wafer testing apparatus

LSI diagnostic system and method of diagnosing LSI

Method for processing formation and sale of merchandise by means of...

Performer collection for promotion video through internet and produ...

Logic determination device for semiconductor integrated device and...