Masaru Shimura

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for optimizing a pattern generation program, a program, and...
- Patent number 7,404,130
- Issue date Jul 22, 2008
- Agilent Technologies, Inc.
- Masaru Shimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for optimizing a pattern generation program, a program, and...
- Publication number 20060041809
- Publication date Feb 23, 2006
- AGILENT TECHNOLOGIES INC.,
- Masaru Shimura
- G01 - MEASURING TESTING