Masaru Sugimoto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test circuit for evaluating characteristic of analog signal of device
- Patent number 7,079,060
- Issue date Jul 18, 2006
- Renesas Technology Corp.
- Toshiaki Tarui
- G01 - MEASURING TESTING
Information Patent Grant
Interface circuit coupling semiconductor test apparatus with tested...
- Patent number 6,954,079
- Issue date Oct 11, 2005
- Renesas Technology Corp.
- Masaru Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
LSI testing apparatus
- Patent number 6,546,525
- Issue date Apr 8, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Sugimoto
- G01 - MEASURING TESTING
Information Patent Grant
LSI testing apparatus and timing calibration method for use therewith
- Patent number 6,281,698
- Issue date Aug 28, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Sugimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Test circuit for evaluating characteristic of analog signal of device
- Publication number 20050179576
- Publication date Aug 18, 2005
- RENESAS TECHNOLOGY CORP.
- Toshiaki Tarui
- G01 - MEASURING TESTING
Information Patent Application
Interface circuit coupling semiconductor test apparatus with tested...
- Publication number 20040113642
- Publication date Jun 17, 2004
- RENESAS TECHNOLOGY CORP.
- Masaru Sugimoto
- G01 - MEASURING TESTING
Information Patent Application
LSI testing apparatus
- Publication number 20020007479
- Publication date Jan 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Masaru Sugimoto
- G01 - MEASURING TESTING