Masaru Tsuto

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus and test method
- Patent number 9,262,376
- Issue date Feb 16, 2016
- Advantest Corporation
- Masaru Tsuto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 8,743,702
- Issue date Jun 3, 2014
- Advantest Corporation
- Shinichi Ishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus and test method
- Patent number 8,692,566
- Issue date Apr 8, 2014
- Advantest Corporation
- Shinichi Ishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus and test method
- Patent number 8,666,691
- Issue date Mar 4, 2014
- Advantest Corporation
- Shinichi Ishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus and test method
- Patent number 8,483,073
- Issue date Jul 9, 2013
- Advantest Corporation
- Shinichi Ishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus additional module and test method
- Patent number 8,362,791
- Issue date Jan 29, 2013
- Advantest Corporation
- Motoo Ueda
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 8,165,027
- Issue date Apr 24, 2012
- Advantest Corporation
- Shinichi Ishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus and test method
- Patent number 8,149,721
- Issue date Apr 3, 2012
- Advantest Corporation
- Shinichi Ishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus and test method
- Patent number 8,059,547
- Issue date Nov 15, 2011
- Advantest Corporation
- Masaru Goishi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test pattern generator, a testing device, and a method of generatin...
- Patent number 6,769,083
- Issue date Jul 27, 2004
- Advantest Corporation
- Masaru Tsuto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing apparatus
- Patent number 6,678,852
- Issue date Jan 13, 2004
- Advantest Corporation
- Masaru Tsuto
- G01 - MEASURING TESTING
Information Patent Grant
Pattern generating method, pattern generator using the method, and...
- Patent number 6,601,204
- Issue date Jul 29, 2003
- Advantest Corporation
- Masaru Tsuto
- G11 - INFORMATION STORAGE
Information Patent Grant
Pattern generator and electric part testing apparatus
- Patent number 6,499,126
- Issue date Dec 24, 2002
- Advantest Corporation
- Masaru Tsuto
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generator, a memory testing device, and a method of ge...
- Patent number 6,484,282
- Issue date Nov 19, 2002
- Advantest Corporation
- Masaru Tsuto
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device tester
- Patent number 6,363,022
- Issue date Mar 26, 2002
- Advantest Corporation
- Masaru Tsuto
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory testing apparatus
- Patent number 6,138,259
- Issue date Oct 24, 2000
- Advantest Corporation
- Masaru Tsuto
- G11 - INFORMATION STORAGE
Information Patent Grant
Test pattern generator
- Patent number 6,032,275
- Issue date Feb 29, 2000
- Advantest Corp.
- Masaru Tsuto
- G11 - INFORMATION STORAGE
Information Patent Grant
Test pattern generator
- Patent number 5,850,402
- Issue date Dec 15, 1998
- Advantest Corp.
- Masaru Tsuto
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20130158905
- Publication date Jun 20, 2013
- Advantest Corporation
- Masaru Tsuto
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20120133380
- Publication date May 31, 2012
- Advantest Corporation
- Shinichi ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND DEBUG METHOD
- Publication number 20120136603
- Publication date May 31, 2012
- Advantest Corporation
- Shinichi ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110288810
- Publication date Nov 24, 2011
- Advantest Corporation
- Shinichi ISHIKAWA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110137606
- Publication date Jun 9, 2011
- Advantest Corporation
- Shinichi ISHIKAWA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20100142393
- Publication date Jun 10, 2010
- Advantest Corporation
- Shinichi ISHIKAWA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20100142383
- Publication date Jun 10, 2010
- Advantest Corporation
- MASARU GOISHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20100142391
- Publication date Jun 10, 2010
- Advantest Corporation
- Shinichi Ishikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20100142392
- Publication date Jun 10, 2010
- Advantest Corporation
- Shinichi ISHIKAWA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS ADDITIONAL MODULE AND TEST METHOD
- Publication number 20100102840
- Publication date Apr 29, 2010
- Advantest Corporation
- Motoo UEDA
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory device tester
- Publication number 20020016941
- Publication date Feb 7, 2002
- Masaru Tsuto
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device testing apparatus
- Publication number 20010047500
- Publication date Nov 29, 2001
- Advantest Corporation
- Masaru Tsuto
- G01 - MEASURING TESTING

Masaru Tsuto

Person

Patents Grantslast 30 patents

Test apparatus and test method

Test apparatus and test method

Test apparatus and test method

Test apparatus and test method

Test apparatus and test method

Test apparatus additional module and test method

Test apparatus and test method

Test apparatus and test method

Test apparatus and test method

Test pattern generator, a testing device, and a method of generatin...

Semiconductor device testing apparatus

Pattern generating method, pattern generator using the method, and...

Pattern generator and electric part testing apparatus

Test pattern generator, a memory testing device, and a method of ge...

Semiconductor memory device tester

Semiconductor memory testing apparatus

Test pattern generator

Test pattern generator

Patents Applicationslast 30 patents

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND DEBUG METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

TEST APPARATUS ADDITIONAL MODULE AND TEST METHOD

Semiconductor memory device tester

Semiconductor device testing apparatus