Masaru WAKABAYASHI

Person

Ibaraki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 10,527,872
- Issue date Jan 7, 2020
- Renesas Electronics Corporation
- Hiroyuki Kunishima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 10,317,769
- Issue date Jun 11, 2019
- Renesas Electronics Corporation
- Shinichi Watanuki
- G02 - OPTICS
Information Patent Grant
Optical semiconductor device, and method for producing the same
- Patent number 10,295,743
- Issue date May 21, 2019
- Renesas Electronics Corporation
- Hiroyuki Kunishima
- G02 - OPTICS
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 10,162,110
- Issue date Dec 25, 2018
- Renesas Electronics Corporation
- Tatsuya Usami
- G02 - OPTICS
Information Patent Grant
Semiconductor device
- Patent number 9,835,882
- Issue date Dec 5, 2017
- Renesas Electronics Corporation
- Hiroyuki Kunishima
- G02 - OPTICS
Information Patent Grant
Optical semiconductor device
- Patent number 9,508,662
- Issue date Nov 29, 2016
- Renesas Electronics Corporation
- Hiroyuki Kunishima
- G02 - OPTICS
Information Patent Grant
Integrated circuit device with MIM capacitance circuit and method o...
- Patent number 6,638,816
- Issue date Oct 28, 2003
- NEC Electronics Corporation
- Masaru Wakabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of semiconductor with a cleansing agent
- Patent number 6,472,287
- Issue date Oct 29, 2002
- NEC Corporation
- Masaru Wakabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device with MIM capacitance circuit
- Patent number 6,410,953
- Issue date Jun 25, 2002
- NEC Corporation
- Masaru Wakabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and its manufacture
- Patent number 6,297,119
- Issue date Oct 2, 2001
- NEC Corporation
- Yutaka Tsutsui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring collector and emitter breakdown voltage of bip...
- Patent number 6,292,011
- Issue date Sep 18, 2001
- NEC Corporation
- Masaru Wakabayashi
- G01 - MEASURING TESTING
Information Patent Grant
Tri-voltage Bi-CMOS semiconductor device
- Patent number 6,150,699
- Issue date Nov 21, 2000
- NEC Corporation
- Masaru Wakabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing Bi-CMOS
- Patent number 5,904,519
- Issue date May 18, 1999
- NEC Corporation
- Masaru Wakabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor devices
- Patent number 5,691,214
- Issue date Nov 25, 1997
- NEC Corporation
- Masaru Wakabayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180341165
- Publication date Nov 29, 2018
- RENESAS ELECTRONICS CORPORATION
- Shinichi WATANUKI
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180052338
- Publication date Feb 22, 2018
- RENESAS ELECTRONICS CORPORATION
- Hiroyuki KUNISHIMA
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20170068047
- Publication date Mar 9, 2017
- RENESAS ELECTRONICS CORPORATION
- TATSUYA USAMI
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160334573
- Publication date Nov 17, 2016
- RENESAS ELECTRONICS CORPORATION
- Hiroyuki KUNISHIMA
- G02 - OPTICS
Information Patent Application
OPTICAL SEMICONDUCTOR DEVICE
- Publication number 20160056115
- Publication date Feb 25, 2016
- Renesas Electronics Corporation
- Hiroyuki Kunishima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SEMICONDUCTOR DEVICE, AND METHOD FOR PRODUCING THE SAME
- Publication number 20160054521
- Publication date Feb 25, 2016
- Renesas Electronics Corporation
- Hiroyuki Kunishima
- G02 - OPTICS
Information Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20020127832
- Publication date Sep 12, 2002
- NEC Corporation
- Masaru Wakabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit device with MIM capacitance circuit and method o...
- Publication number 20020115286
- Publication date Aug 22, 2002
- Masaru Wakabayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit device with MIM capacitance circuit and method o...
- Publication number 20010026972
- Publication date Oct 4, 2001
- NEC Corporation
- Masaru Wakabayashi
- H01 - BASIC ELECTRIC ELEMENTS

Masaru WAKABAYASHI

Person

Patents Grantslast 30 patents

Semiconductor device

Semiconductor device

Optical semiconductor device, and method for producing the same

Semiconductor device and method for manufacturing the same

Semiconductor device

Optical semiconductor device

Integrated circuit device with MIM capacitance circuit and method o...

Manufacturing method of semiconductor with a cleansing agent

Integrated circuit device with MIM capacitance circuit

Semiconductor device and its manufacture

Method for measuring collector and emitter breakdown voltage of bip...

Tri-voltage Bi-CMOS semiconductor device

Method of manufacturing Bi-CMOS

Method of manufacturing semiconductor devices

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE

OPTICAL SEMICONDUCTOR DEVICE

OPTICAL SEMICONDUCTOR DEVICE, AND METHOD FOR PRODUCING THE SAME

MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

Integrated circuit device with MIM capacitance circuit and method o...

Integrated circuit device with MIM capacitance circuit and method o...