Masashi Hasegawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic apparatus storing container and method for assembling el...
- Patent number 8,575,481
- Issue date Nov 5, 2013
- NEC Corporation
- Masashi Hasegawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electrical connecting apparatus and testing system using the same
- Patent number 8,525,539
- Issue date Sep 3, 2013
- Kabushiki Kaisha Nihon Micronics
- Kenichi Washio
- G01 - MEASURING TESTING
Information Patent Grant
Contact and electrical connecting apparatus
- Patent number 8,460,010
- Issue date Jun 11, 2013
- Kabushiki Kaisha Nihon Micronics
- Ken Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for integrated circuit
- Patent number 8,253,433
- Issue date Aug 28, 2012
- Kabushiki Kaisha Nihon Micronics
- Kenichi Washio
- G01 - MEASURING TESTING
Information Patent Grant
Stacked package and method for forming stacked package
- Patent number 7,936,058
- Issue date May 3, 2011
- Kabushiki Kaisha Nihon Micronics
- Masashi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe assembly
- Patent number 7,532,020
- Issue date May 12, 2009
- Kabushiki Kaisha Nihon Micronics
- Yoshiei Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Personal computer cooling device having hinged heat pipe
- Patent number 6,122,166
- Issue date Sep 19, 2000
- Fujikura Ltd.
- Masataka Mochizuki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heat pipe and process for manufacturing the same
- Patent number 5,694,295
- Issue date Dec 2, 1997
- Fujikura Ltd.
- Masataka Mochizuki
- F28 - HEAT EXCHANGE IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS
- Publication number 20130187676
- Publication date Jul 25, 2013
- KABUSHIKI KAISHA NIHON MICRONICS
- Kenichi WASHIO
- G01 - MEASURING TESTING
Information Patent Application
CONTACT AND ELECTRICAL CONNECTING APPARATUS
- Publication number 20120129408
- Publication date May 24, 2012
- Kabushiki Kaisha Nihon Micronics
- Ken Kimura
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS AND TESTING SYSTEM USING THE SAME
- Publication number 20110095779
- Publication date Apr 28, 2011
- Kabushiki Kaisha Nihon Micronics
- Kenichi WASHIO
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS FOR INTEGRATED CIRCUIT
- Publication number 20110001506
- Publication date Jan 6, 2011
- Kabushiki Kaisha Nihon Micronics
- Kenichi WASHIO
- G01 - MEASURING TESTING
Information Patent Application
STACKED PACKAGE AND METHOD FOR FORMING STACKED PACKAGE
- Publication number 20100013072
- Publication date Jan 21, 2010
- Kabushiki Kaisha Nihon Micronics
- Masashi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE ASSEMBLY
- Publication number 20080007282
- Publication date Jan 10, 2008
- Kabushiki Kaisha Nihon Micronics
- Yoshiei Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Probing apparatus
- Publication number 20070159194
- Publication date Jul 12, 2007
- Yoshiei Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Probing apparatus
- Publication number 20070159192
- Publication date Jul 12, 2007
- Yoshiei Hasegawa
- G01 - MEASURING TESTING

Masashi Hasegawa

Person

Patents Grantslast 30 patents

Electronic apparatus storing container and method for assembling el...

Electrical connecting apparatus and testing system using the same

Contact and electrical connecting apparatus

Testing apparatus for integrated circuit

Stacked package and method for forming stacked package

Probe assembly

Personal computer cooling device having hinged heat pipe

Heat pipe and process for manufacturing the same

Patents Applicationslast 30 patents

INSPECTION APPARATUS

CONTACT AND ELECTRICAL CONNECTING APPARATUS

ELECTRICAL CONNECTING APPARATUS AND TESTING SYSTEM USING THE SAME

TESTING APPARATUS FOR INTEGRATED CIRCUIT

STACKED PACKAGE AND METHOD FOR FORMING STACKED PACKAGE

PROBE ASSEMBLY

Probing apparatus

Probing apparatus