Masashi Iwatsuki

Follow

Person

Mizuhomachi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
TEM sample equipped with an identifying function, focused ion beam...
- Patent number 7,095,024
- Issue date Aug 22, 2006
- SII NanoTechnology Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 5,128,544
- Issue date Jul 7, 1992
- Jeol Ltd.
- Masashi Iwatsuki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning device for scanning tunneling microscope
- Patent number 4,894,538
- Issue date Jan 16, 1990
- Jeol Ltd.
- Masashi Iwatsuki
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
TEM sample equipped with an identifying function, focused ion beam...
- Publication number 20040227082
- Publication date Nov 18, 2004
- Tatsuya Adachi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL