Masashi Kurita

Person

Nara, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspecting device, defect inspecting method, and storage medium
- Patent number 11,830,174
- Issue date Nov 28, 2023
- Omron Corporation
- Yasuyuki Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing device, image processing method, and image process...
- Patent number 11,769,248
- Issue date Sep 26, 2023
- Omron Corporation
- Masashi Kurita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device, system and computer-program product for setting lig...
- Patent number 11,631,230
- Issue date Apr 18, 2023
- Omron Corporation
- Yosuke Naruse
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing device, image processing method, and computer read...
- Patent number 11,574,397
- Issue date Feb 7, 2023
- Omron Corporation
- Yasuyuki Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, apparatus and system for determining feature data of image...
- Patent number 11,461,996
- Issue date Oct 4, 2022
- Omron Corporation
- Masashi Kurita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device, defect inspection method, and computer re...
- Patent number 11,301,978
- Issue date Apr 12, 2022
- Omron Corporation
- Yasuyuki Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, device, system and computer-program product for setting lig...
- Patent number 11,240,441
- Issue date Feb 1, 2022
- Omron Corporation
- Yosuke Naruse
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data generation apparatus, data generation method, and data generat...
- Patent number 11,176,650
- Issue date Nov 16, 2021
- Omron Corporation
- Masashi Kurita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus, data generation apparatus, data generation me...
- Patent number 10,885,618
- Issue date Jan 5, 2021
- Omron Corporation
- Yuki Hanzawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data generation apparatus, data generation method, and data generat...
- Patent number 10,878,283
- Issue date Dec 29, 2020
- Omron Corporation
- Masashi Kurita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus, defect inspection method, and non-tran...
- Patent number 10,776,909
- Issue date Sep 15, 2020
- Omron Corporation
- Yasuyuki Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing device and image processing method
- Patent number 9,189,694
- Issue date Nov 17, 2015
- Omron Corporation
- Norikazu Tonogai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE...
- Publication number 20240233349
- Publication date Jul 11, 2024
- Omron Corporation
- Yutaka Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE...
- Publication number 20240135692
- Publication date Apr 25, 2024
- Omron Corporation
- Yutaka Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS, UNIT SELECTION APPARATUS, INSPECTION METHOD,...
- Publication number 20230222645
- Publication date Jul 13, 2023
- Omron Corporation
- Masashi KURITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND COMPUTER READ...
- Publication number 20210233231
- Publication date Jul 29, 2021
- Omron Corporation
- Yasuyuki IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTING DEVICE, DEFECT INSPECTING METHOD, AND STORAGE MEDIUM
- Publication number 20210183052
- Publication date Jun 17, 2021
- Omron Corporation
- Yasuyuki IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND IMAGE PROCESS...
- Publication number 20210183037
- Publication date Jun 17, 2021
- Omron Corporation
- Masashi KURITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS AND SYSTEM FOR DETERMINING FEATURE DATA OF IMAGE...
- Publication number 20210049398
- Publication date Feb 18, 2021
- Omron Corporation
- Masashi KURITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, DEVICE, SYSTEM AND COMPUTER-PROGRAM PRODUCT FOR SETTING LI...
- Publication number 20200410270
- Publication date Dec 31, 2020
- Omron Corporation
- Yosuke NARUSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, DEVICE, SYSTEM AND COMPUTER-PROGRAM PRODUCT FOR SETTING LIG...
- Publication number 20200412932
- Publication date Dec 31, 2020
- Omron Corporation
- Yosuke NARUSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND COMPUTER RE...
- Publication number 20190287235
- Publication date Sep 19, 2019
- Omron Corporation
- Yasuyuki IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA GENERATION APPARATUS, DATA GENERATION METHOD, AND DATA GENERAT...
- Publication number 20190197356
- Publication date Jun 27, 2019
- Omron Corporation
- Masashi KURITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS, DEFECT INSPECTION METHOD, AND PROGRAM...
- Publication number 20190147586
- Publication date May 16, 2019
- Omron Corporation
- Yasuyuki IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA GENERATION APPARATUS, DATA GENERATION METHOD, AND DATA GENERAT...
- Publication number 20190139213
- Publication date May 9, 2019
- Omron Corporation
- Masashi KURITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS, DATA GENERATION APPARATUS, DATA GENERATION ME...
- Publication number 20190139212
- Publication date May 9, 2019
- Omron Corporation
- Yuki HANZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD
- Publication number 20140093172
- Publication date Apr 3, 2014
- Omron Corporation
- Norikazu Tonogai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND IMAGE PROCESS...
- Publication number 20120237118
- Publication date Sep 20, 2012
- Omron Corporation
- Tadashi HYUGA
- G06 - COMPUTING CALCULATING COUNTING

Masashi Kurita

Person

Patents Grantslast 30 patents

Defect inspecting device, defect inspecting method, and storage medium

Image processing device, image processing method, and image process...

Method, device, system and computer-program product for setting lig...

Image processing device, image processing method, and computer read...

Method, apparatus and system for determining feature data of image...

Defect inspection device, defect inspection method, and computer re...

Method, device, system and computer-program product for setting lig...

Data generation apparatus, data generation method, and data generat...

Inspection apparatus, data generation apparatus, data generation me...

Data generation apparatus, data generation method, and data generat...

Defect inspection apparatus, defect inspection method, and non-tran...

Image processing device and image processing method

Patents Applicationslast 30 patents

INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE...

INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE...

INSPECTION APPARATUS, UNIT SELECTION APPARATUS, INSPECTION METHOD,...

IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND COMPUTER READ...

DEFECT INSPECTING DEVICE, DEFECT INSPECTING METHOD, AND STORAGE MEDIUM

IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND IMAGE PROCESS...

METHOD, APPARATUS AND SYSTEM FOR DETERMINING FEATURE DATA OF IMAGE...

METHOD, DEVICE, SYSTEM AND COMPUTER-PROGRAM PRODUCT FOR SETTING LI...

METHOD, DEVICE, SYSTEM AND COMPUTER-PROGRAM PRODUCT FOR SETTING LIG...

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND COMPUTER RE...

DATA GENERATION APPARATUS, DATA GENERATION METHOD, AND DATA GENERAT...

DEFECT INSPECTION APPARATUS, DEFECT INSPECTION METHOD, AND PROGRAM...

DATA GENERATION APPARATUS, DATA GENERATION METHOD, AND DATA GENERAT...

INSPECTION APPARATUS, DATA GENERATION APPARATUS, DATA GENERATION ME...

IMAGE PROCESSING DEVICE AND IMAGE PROCESSING METHOD

IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, AND IMAGE PROCESS...