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Masashi Saitoh
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Chiba, JP
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last 30 patents
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Patent Grant
Microparticle analysis apparatus
Patent number
8,976,352
Issue date
Mar 10, 2015
Sony Corporation
Yosuke Muraki
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
MICROPARTICLE ANALYSIS APPARATUS
Publication number
20130050698
Publication date
Feb 28, 2013
SONY CORPORATION
Yosuke Muraki
G01 - MEASURING TESTING