Masashi Sakamoto

Person

Ome-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern matching method and apparatus
- Patent number 10,318,805
- Issue date Jun 11, 2019
- Hitachi High-Technologies Corporation
- Hideki Nakayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 9,922,414
- Issue date Mar 20, 2018
- Hitachi High-Technologies Corporation
- Yuji Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect observation system and defect observation method
- Patent number 9,842,723
- Issue date Dec 12, 2017
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern defect analysis equipment, pattern defect analysis method a...
- Patent number 8,280,148
- Issue date Oct 2, 2012
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern defect analysis equipment, pattern defect analysis method a...
- Patent number 8,121,393
- Issue date Feb 21, 2012
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,847,249
- Issue date Dec 7, 2010
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Bet control method for race game
- Patent number 7,607,975
- Issue date Oct 27, 2009
- Sega Corporation
- Naoyuki Sato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection apparatus
- Patent number 7,504,627
- Issue date Mar 17, 2009
- Hitachi High-Technologies Corporation
- Masakazu Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,307,253
- Issue date Dec 11, 2007
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,307,254
- Issue date Dec 11, 2007
- Hitachi High-Technologies Corporation
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection apparatus
- Patent number 7,256,400
- Issue date Aug 14, 2007
- Hitachi High-Technologies Corporation
- Masakazu Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of observing a specimen using a scanning electron microscope
- Patent number 7,075,077
- Issue date Jul 11, 2006
- Hitachi High-Technologies Corporation
- Hirohito Okuda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
- Publication number 20160019682
- Publication date Jan 21, 2016
- Hitachi High-Technologies Corporation
- Yuji TAKAGI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT OBSERVATION SYSTEM AND DEFECT OBSERVATION METHOD
- Publication number 20150214000
- Publication date Jul 30, 2015
- Hitachi High-Technologies Corporation
- Takehiro Hirai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MATCHING METHOD AND APPARATUS
- Publication number 20130278748
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Hideki Nakayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLER AND DEVICE
- Publication number 20130198415
- Publication date Aug 1, 2013
- Kabushiki Kaisha Toshiba
- Yuuichi Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEM TYPE DEFECT OBSERVATION DEVICE AND DEFECT IMAGE ACQUIRING METHOD
- Publication number 20120327212
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Katsuhiro Kitahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DEFECT ANALYSIS EQUIPMENT, PATTERN DEFECT ANALYSIS METHOD A...
- Publication number 20120114221
- Publication date May 10, 2012
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTERFACE DEVICE, DECODED DATA VALIDITY DETERMINATION METHOD AND RE...
- Publication number 20110296286
- Publication date Dec 1, 2011
- Kabushiki Kaisha Toshiba
- Masashi Sakamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN DEFECT ANALYSIS EQUIPMENT, PATTERN DEFECT ANALYSIS METHOD A...
- Publication number 20090180680
- Publication date Jul 16, 2009
- Hitachi High-Technologies Corporation
- Norio Satou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REVIEWING APPARATUS, RECIPE SETTING METHOD FOR REVIEWING APPARATUS...
- Publication number 20090030867
- Publication date Jan 29, 2009
- Hitachi High-Technologies Corporation
- Takehiro HIRAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20080185519
- Publication date Aug 7, 2008
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Electron beam inspection apparatus
- Publication number 20070272860
- Publication date Nov 29, 2007
- Hitachi High-Technologies Corporation
- Masakazu Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20060043294
- Publication date Mar 2, 2006
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20050236569
- Publication date Oct 27, 2005
- Kohei Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam inspection apparatus
- Publication number 20050234672
- Publication date Oct 20, 2005
- Masakazu Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Mobile phone and vibration control method of mobile phone
- Publication number 20050208903
- Publication date Sep 22, 2005
- Kabushiki Kaisha Toshiba
- Masashi Sakamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method of observing a specimen using a scanning electron microscope
- Publication number 20050194533
- Publication date Sep 8, 2005
- Hirohito Okuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Bet control method for race game
- Publication number 20030054870
- Publication date Mar 20, 2003
- Naoyuki Sato
- G06 - COMPUTING CALCULATING COUNTING

Masashi Sakamoto

Person

Patents Grantslast 30 patents

Pattern matching method and apparatus

Defect inspection method and defect inspection device

Defect observation system and defect observation method

Pattern defect analysis equipment, pattern defect analysis method a...

Pattern defect analysis equipment, pattern defect analysis method a...

Charged particle beam apparatus

Bet control method for race game

Electron beam inspection apparatus

Scanning electron microscope

Scanning electron microscope

Electron beam inspection apparatus

Method of observing a specimen using a scanning electron microscope

Patents Applicationslast 30 patents

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

DEFECT OBSERVATION SYSTEM AND DEFECT OBSERVATION METHOD

PATTERN MATCHING METHOD AND APPARATUS

CONTROLLER AND DEVICE

SEM TYPE DEFECT OBSERVATION DEVICE AND DEFECT IMAGE ACQUIRING METHOD

PATTERN DEFECT ANALYSIS EQUIPMENT, PATTERN DEFECT ANALYSIS METHOD A...

INTERFACE DEVICE, DECODED DATA VALIDITY DETERMINATION METHOD AND RE...

PATTERN DEFECT ANALYSIS EQUIPMENT, PATTERN DEFECT ANALYSIS METHOD A...

REVIEWING APPARATUS, RECIPE SETTING METHOD FOR REVIEWING APPARATUS...

Charged particle beam apparatus

Electron beam inspection apparatus

Scanning electron microscope

Scanning electron microscope

Electron beam inspection apparatus

Mobile phone and vibration control method of mobile phone

Method of observing a specimen using a scanning electron microscope

Bet control method for race game