Masashi Sasaki

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Mito, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 10,297,416
- Issue date May 21, 2019
- Hitachi High-Technologies Corporation
- Toshihide Agemura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus using an electrostatic lens gun
- Patent number 8,399,863
- Issue date Mar 19, 2013
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and specimen holder
- Patent number 7,812,310
- Issue date Oct 12, 2010
- Hitachi High-Technologies Corporation
- Hiroyuki Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and specimen holder
- Patent number 7,381,968
- Issue date Jun 3, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Tanaka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Scanning Electron Microscope
- Publication number 20170309437
- Publication date Oct 26, 2017
- Hitachi High-Technologies Corporation
- Toshihide AGEMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE GUN AND FOCUSED ION BEAM APPARATUS USING THE GUN
- Publication number 20110186745
- Publication date Aug 4, 2011
- Hiroyasu Kqaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and specimen holder
- Publication number 20080315097
- Publication date Dec 25, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and specimen holder
- Publication number 20050230636
- Publication date Oct 20, 2005
- Hiroyuki Tanaka
- H01 - BASIC ELECTRIC ELEMENTS