Masataka IKESU

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor fault analysis device and semiconductor fault analysi...
- Patent number 12,203,974
- Issue date Jan 21, 2025
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor failure analysis device
- Patent number 12,163,900
- Issue date Dec 10, 2024
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis device and semiconductor failure ana...
- Patent number 12,117,480
- Issue date Oct 15, 2024
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- G01 - MEASURING TESTING
Information Patent Grant
Solid immersion lens unit and semiconductor inspection device
- Patent number 11,913,888
- Issue date Feb 27, 2024
- Hamamatsu Photonics K.K.
- Xiangguang Mao
- G01 - MEASURING TESTING
Information Patent Grant
Solid immersion lens holder and image acquisition device
- Patent number 10,558,010
- Issue date Feb 11, 2020
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS
Information Patent Grant
Solid immersion lens holder and image acquisition device
- Patent number 10,545,309
- Issue date Jan 28, 2020
- Hamamatsu Photonics K.K.
- Hirotoshi Terada
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...
- Publication number 20240393384
- Publication date Nov 28, 2024
- HAMAMATSU PHOTONICS K. K.
- Masataka IKESU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...
- Publication number 20240361382
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE
- Publication number 20230087835
- Publication date Mar 23, 2023
- Hamamatsu Photonics K.K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...
- Publication number 20230072615
- Publication date Mar 9, 2023
- Hamamatsu Photonics K.K.
- Masataka IKESU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...
- Publication number 20230061399
- Publication date Mar 2, 2023
- Hamamatsu Photonics K.K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
WAFER CONVEYANCE UNIT AND WAFER CONVEYANCE METHOD
- Publication number 20220406644
- Publication date Dec 22, 2022
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOLID IMMERSION LENS UNIT AND SEMICONDUCTOR INSPECTION DEVICE
- Publication number 20210333216
- Publication date Oct 28, 2021
- Hamamatsu Photonics K.K.
- Xiangguang MAO
- G01 - MEASURING TESTING
Information Patent Application
SOLID IMMERSION LENS HOLDER AND IMAGE ACQUISITION DEVICE
- Publication number 20170285296
- Publication date Oct 5, 2017
- Hamamatsu Photonics K.K.
- Hirotoshi TERADA
- G02 - OPTICS
Information Patent Application
SOLID IMMERSION LENS HOLDER AND IMAGE ACQUISITION DEVICE
- Publication number 20170235087
- Publication date Aug 17, 2017
- Hamamatsu Photonics K.K.
- Hirotoshi TERADA
- G02 - OPTICS

Masataka IKESU

Person

Patents Grantslast 30 patents

Semiconductor fault analysis device and semiconductor fault analysi...

Semiconductor failure analysis device

Semiconductor failure analysis device and semiconductor failure ana...

Solid immersion lens unit and semiconductor inspection device

Solid immersion lens holder and image acquisition device

Solid immersion lens holder and image acquisition device

Patents Applicationslast 30 patents

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...

SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...

SEMICONDUCTOR FAILURE ANALYSIS DEVICE

SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...

WAFER CONVEYANCE UNIT AND WAFER CONVEYANCE METHOD

SOLID IMMERSION LENS UNIT AND SEMICONDUCTOR INSPECTION DEVICE

SOLID IMMERSION LENS HOLDER AND IMAGE ACQUISITION DEVICE

SOLID IMMERSION LENS HOLDER AND IMAGE ACQUISITION DEVICE