Masataka Koga

Person

Katsuta, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Particle counting apparatus for a total counting of particles conta...
- Patent number 5,365,559
- Issue date Nov 15, 1994
- Hitachi, Ltd.
- Yu-Ming Hsueh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Plasma mass spectrometer
- Patent number 5,308,977
- Issue date May 3, 1994
- Hitachi, Ltd.
- Konosuke Oishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for analysis of gases using plasma
- Patent number 5,252,827
- Issue date Oct 12, 1993
- Hitachi, Ltd.
- Masataka Koga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical method and apparatus using capillary tube
- Patent number 5,211,829
- Issue date May 18, 1993
- Hitachi, Ltd.
- Kazumichi Imai
- G01 - MEASURING TESTING
Information Patent Grant
High sensitive element analyzing method and apparatus of the same
- Patent number 5,202,562
- Issue date Apr 13, 1993
- Hitachi, Ltd.
- Masataka Koga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for mass spectrometric analysis
- Patent number 5,164,592
- Issue date Nov 17, 1992
- Hitachi, Ltd.
- Takehiko Kitamori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer using plasma ion source
- Patent number 5,148,021
- Issue date Sep 15, 1992
- Hitachi, Ltd.
- Yukio Okamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of and apparatus for analyzing granular materials
- Patent number 5,122,752
- Issue date Jun 16, 1992
- Hitachi, Ltd.
- Masataka Koga
- G01 - MEASURING TESTING
Information Patent Grant
Microwave induced plasma source
- Patent number 5,086,255
- Issue date Feb 4, 1992
- Hitachi, Ltd.
- Yukio Okamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma source mass spectrometer
- Patent number 4,963,735
- Issue date Oct 16, 1990
- Hitachi, Ltd.
- Yukio Okamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atomic absorption spectrophotometer
- Patent number 4,948,250
- Issue date Aug 14, 1990
- Hitachi, Ltd.
- Konosuke Oishi
- G01 - MEASURING TESTING
Information Patent Grant
Trace element spectrometry with plasma source
- Patent number 4,902,099
- Issue date Feb 20, 1990
- Hitachi, Ltd.
- Yukio Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Atomic absorption spectrophotometer
- Patent number 4,718,763
- Issue date Jan 12, 1988
- Hitachi, Ltd.
- Kounosuke Oishi
- G01 - MEASURING TESTING
Information Patent Grant
Double polarized light beam spectrophotometer of light source modul...
- Patent number 4,645,341
- Issue date Feb 24, 1987
- Hitachi, Ltd.
- Masataka Koga
- G01 - MEASURING TESTING
Information Patent Grant
Spectral source, particularly for atomic absorption spectrometry
- Patent number 4,198,589
- Issue date Apr 15, 1980
- Hitachi, Ltd.
- Shinji Mayama
- H01 - BASIC ELECTRIC ELEMENTS

Masataka Koga

Person

Patents Grantslast 30 patents

Particle counting apparatus for a total counting of particles conta...

Plasma mass spectrometer

Method and apparatus for analysis of gases using plasma

Analytical method and apparatus using capillary tube

High sensitive element analyzing method and apparatus of the same

Method and apparatus for mass spectrometric analysis

Mass spectrometer using plasma ion source

Method of and apparatus for analyzing granular materials

Microwave induced plasma source

Plasma source mass spectrometer

Atomic absorption spectrophotometer

Trace element spectrometry with plasma source

Atomic absorption spectrophotometer

Double polarized light beam spectrophotometer of light source modul...

Spectral source, particularly for atomic absorption spectrometry