Masataka ONOZAWA

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic component handling apparatus and electronic component te...
- Patent number 11,353,502
- Issue date Jun 7, 2022
- Advantest Corporation
- Masataka Onozawa
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component handling apparatus, electronic component testi...
- Patent number 10,324,127
- Issue date Jun 18, 2019
- Advantest Corporation
- Yasuyuki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Detector for detecting position of IC device and method for the same
- Patent number 10,297,043
- Issue date May 21, 2019
- Advantest Corporation
- Masataka Onozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Handler apparatus that conveys a device under test to a test socket...
- Patent number 9,784,789
- Issue date Oct 10, 2017
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Handler apparatus, adjustment method of handler apparatus, and test...
- Patent number 9,658,287
- Issue date May 23, 2017
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Handler apparatus that conveys a device under test to a test socket...
- Patent number 9,606,170
- Issue date Mar 28, 2017
- Advantest Corporation
- Tsuyoshi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Actuator, handler apparatus and test apparatus
- Patent number 9,453,874
- Issue date Sep 27, 2016
- Advantest Corporation
- Aritomo Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Handler and test apparatus
- Patent number 9,316,686
- Issue date Apr 19, 2016
- Advantest Corporation
- Hiromitsu Horino
- G01 - MEASURING TESTING
Information Patent Grant
Handler for conveying a plurality of devices under test to a socket...
- Patent number 9,024,648
- Issue date May 5, 2015
- Advantest Corporation
- Hiromitsu Horino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
- Publication number 20210285999
- Publication date Sep 16, 2021
- Advantest Corporation
- Masataka Onozawa
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...
- Publication number 20180356460
- Publication date Dec 13, 2018
- Advantest Corporation
- Yasuyuki KATO
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR FOR DETECTING POSITION OF IC DEVICE AND METHOD FOR THE SAME
- Publication number 20180294244
- Publication date Oct 11, 2018
- Advantest Corporation
- Masataka ONOZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Handler Apparatus and Test Apparatus
- Publication number 20150276863
- Publication date Oct 1, 2015
- Advantest Corporation
- Tsuyoshi YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
Handler Apparatus and Test Apparatus
- Publication number 20150276862
- Publication date Oct 1, 2015
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
HANDLER APPARATUS, ADJUSTMENT METHOD OF HANDLER APPARATUS, AND TEST...
- Publication number 20150276861
- Publication date Oct 1, 2015
- Advantest Corporation
- Tsuyoshi YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
ACTUATOR, HANDLER APPARATUS AND TEST APPARATUS
- Publication number 20150276852
- Publication date Oct 1, 2015
- Advantest Corporation
- Aritomo KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
HANDLER AND TEST APPARATUS
- Publication number 20130181734
- Publication date Jul 18, 2013
- Advantest Corporation
- Hiromitsu HORINO
- G01 - MEASURING TESTING
Information Patent Application
HANDLER AND TEST APPARATUS
- Publication number 20130181735
- Publication date Jul 18, 2013
- Advantest Corporation
- Hiromitsu HORINO
- G01 - MEASURING TESTING

Masataka ONOZAWA

Person

Patents Grantslast 30 patents

Electronic component handling apparatus and electronic component te...

Electronic component handling apparatus, electronic component testi...

Detector for detecting position of IC device and method for the same

Handler apparatus that conveys a device under test to a test socket...

Handler apparatus, adjustment method of handler apparatus, and test...

Handler apparatus that conveys a device under test to a test socket...

Actuator, handler apparatus and test apparatus

Handler and test apparatus

Handler for conveying a plurality of devices under test to a socket...

Patents Applicationslast 30 patents

ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...

ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TESTI...

DETECTOR FOR DETECTING POSITION OF IC DEVICE AND METHOD FOR THE SAME

Handler Apparatus and Test Apparatus

Handler Apparatus and Test Apparatus

HANDLER APPARATUS, ADJUSTMENT METHOD OF HANDLER APPARATUS, AND TEST...

ACTUATOR, HANDLER APPARATUS AND TEST APPARATUS

HANDLER AND TEST APPARATUS

HANDLER AND TEST APPARATUS