Masataka Shiratsuchi

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Multi-charged particle beam irradiation apparatus and multi-charged...
- Patent number 11,417,495
- Issue date Aug 16, 2022
- NuFlare Technology, Inc.
- Kazuhiko Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 11,385,192
- Issue date Jul 12, 2022
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- G01 - MEASURING TESTING
Information Patent Grant
Multiple electron beam inspection apparatus and multiple electron b...
- Patent number 11,101,103
- Issue date Aug 24, 2021
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 11,004,193
- Issue date May 11, 2021
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device, inspection method, and storage medium
- Patent number 10,997,713
- Issue date May 4, 2021
- Kabushiki Kaisha Toshiba
- Takeshi Morino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple electron beam inspection apparatus and multiple electron b...
- Patent number 10,984,978
- Issue date Apr 20, 2021
- NuFlare Technology, Inc.
- Hiromu Inoue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection method and pattern inspection apparatus
- Patent number 10,984,525
- Issue date Apr 20, 2021
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 10,846,846
- Issue date Nov 24, 2020
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection apparatus and electron beam inspection method
- Patent number 10,775,326
- Issue date Sep 15, 2020
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 10,762,383
- Issue date Sep 1, 2020
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection apparatus and electron beam inspection method
- Patent number 10,712,295
- Issue date Jul 14, 2020
- NUFLARE TECHNOLOGY, INC.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Thermal laser stimulation apparatus, method of thermally stimulatin...
- Patent number 10,359,468
- Issue date Jul 23, 2019
- TOSHIBA MEMORY CORPORATION
- Juan Felipe Torres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Illumination device and light-guiding member
- Patent number 10,180,529
- Issue date Jan 15, 2019
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- G02 - OPTICS
Information Patent Grant
Charged particle beam inspection apparatus and charged particle bea...
- Patent number 10,041,892
- Issue date Aug 7, 2018
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LED lighting device
- Patent number 9,746,140
- Issue date Aug 29, 2017
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor and manufacturing method thereof
- Patent number 9,484,382
- Issue date Nov 1, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microwave annealing apparatus and method of manufacturing a semicon...
- Patent number 9,466,517
- Issue date Oct 11, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Illuminating device
- Patent number 9,442,239
- Issue date Sep 13, 2016
- Kabushiki Kaisha Toshiba
- Mitsuaki Kato
- G02 - OPTICS
Information Patent Grant
Light beam scanner
- Patent number 9,436,001
- Issue date Sep 6, 2016
- Kabushiki Kaisha Toshiba
- Masataka Shiratsuchi
- G02 - OPTICS
Information Patent Grant
Lighting apparatus
- Patent number 9,410,689
- Issue date Aug 9, 2016
- Kabushiki Kaisha Toshiba
- Mitsuaki Kato
- F21 - LIGHTING
Information Patent Grant
Lighting apparatus with heat transfer and light guiding structure
- Patent number 9,371,967
- Issue date Jun 21, 2016
- Kabushiki Kaisha Toshiba
- Mitsuaki Kato
- F21 - LIGHTING
Information Patent Grant
Projector and portable terminal
- Patent number 9,372,389
- Issue date Jun 21, 2016
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image sensor that includes a boundary region formed between a logic...
- Patent number 9,281,328
- Issue date Mar 8, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Lighting unit and lighting device
- Patent number 9,194,568
- Issue date Nov 24, 2015
- Toshiba Lighting & Technology Corporation
- Takayoshi Moriyama
- F21 - LIGHTING
Information Patent Grant
Image sensor including an image-sensing element region and logic ci...
- Patent number 9,059,060
- Issue date Jun 16, 2015
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for deciding recording media based on light fr...
- Patent number 8,797,607
- Issue date Aug 5, 2014
- Kabushiki Kaisha Toshiba
- Hiromichi Hayashihara
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Surface light source device
- Patent number 8,696,184
- Issue date Apr 15, 2014
- Kabushiki Kaisha Toshiba
- Takeshi Morino
- G02 - OPTICS
Information Patent Grant
Illumination apparatus and image reading apparatus including the same
- Patent number 8,610,967
- Issue date Dec 17, 2013
- Kabushiki Kaisha Toshiba
- Seiji Ikari
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical information recording/reproducing apparatus and method
- Patent number 8,437,236
- Issue date May 7, 2013
- Kabushiki Kaisha Toshiba
- Shinichi Tatsuta
- G11 - INFORMATION STORAGE
Information Patent Grant
Liquid crystal display and backlight module with tilting reflective...
- Patent number 8,400,579
- Issue date Mar 19, 2013
- Kabushiki Kaisha Toshiba
- Yoshiharu Momonoi
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240175829
- Publication date May 30, 2024
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20230088951
- Publication date Mar 23, 2023
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND MULTI-CHARGED...
- Publication number 20210319974
- Publication date Oct 14, 2021
- NuFlare Technology, Inc.
- Kazuhiko INOUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20210010959
- Publication date Jan 14, 2021
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE ELECTRON BEAM INSPECTION APPARATUS AND MULTIPLE ELECTRON B...
- Publication number 20200286709
- Publication date Sep 10, 2020
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE ELECTRON BEAM INSPECTION APPARATUS AND MULTIPLE ELECTRON B...
- Publication number 20200161082
- Publication date May 21, 2020
- NuFlare Technology, Inc.
- Hiromu INOUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Inspection Apparatus and Electron Beam Inspection Method
- Publication number 20190369035
- Publication date Dec 5, 2019
- NUFLARE TECHNOLOGY, INC.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20190346769
- Publication date Nov 14, 2019
- NuFlare Technology, Inc.
- Hideaki Hashimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON BEAM INSPECTION APPARATUS AND ELECTRON BEAM INSPECTION METHOD
- Publication number 20190277782
- Publication date Sep 12, 2019
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND STORAGE MEDIUM
- Publication number 20190279349
- Publication date Sep 12, 2019
- KABUSHIKI KAISHA TOSHIBA
- Takeshi MORINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20190279348
- Publication date Sep 12, 2019
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20190213726
- Publication date Jul 11, 2019
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20190066286
- Publication date Feb 28, 2019
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20190026596
- Publication date Jan 24, 2019
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM INSPECTION APPARATUS AND CHARGED PARTICLE BEA...
- Publication number 20180031498
- Publication date Feb 1, 2018
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G01 - MEASURING TESTING
Information Patent Application
THERMAL LASER STIMULATION APPARATUS, METHOD OF THERMALLY STIMULATIN...
- Publication number 20170269154
- Publication date Sep 21, 2017
- KABUSHIKI KAISHA TOSHIBA
- Juan Felipe TORRES
- G01 - MEASURING TESTING
Information Patent Application
ONE-SIDED EMISSION TYPE TRANSPARENT LIGHT GUIDE PLATE, AND SURFACE-...
- Publication number 20160178829
- Publication date Jun 23, 2016
- KABUSHIKI KAISHA TOSHIBA
- Hiromichi HAYASHIHARA
- G02 - OPTICS
Information Patent Application
Light Beam Scanner
- Publication number 20150378150
- Publication date Dec 31, 2015
- Kabushiki Kaisha Toshiba
- Masataka SHIRATSUCHI
- G02 - OPTICS
Information Patent Application
IMAGE SENSOR AND MANUFACTURING METHOD THEREOF
- Publication number 20150228688
- Publication date Aug 13, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hiroshi OHNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LED LIGHTING DEVICE
- Publication number 20150192258
- Publication date Jul 9, 2015
- Toshiba Materials Co., Ltd.
- Hiroshi Ohno
- F21 - LIGHTING
Information Patent Application
Lighting Apparatus
- Publication number 20150085492
- Publication date Mar 26, 2015
- Kabushiki Kaisha Toshiba
- Mitsuaki Kato
- F21 - LIGHTING
Information Patent Application
PROJECTOR AND PORTABLE TERMINAL
- Publication number 20140333906
- Publication date Nov 13, 2014
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G02 - OPTICS
Information Patent Application
ILLUMINATING DEVICE
- Publication number 20140293654
- Publication date Oct 2, 2014
- KABUSHIKI KAISHA TOSHIBA
- Mitsuaki Kato
- G02 - OPTICS
Information Patent Application
ILLUMINATION DEVICE AND LIGHT-GUIDING MEMBER
- Publication number 20140293645
- Publication date Oct 2, 2014
- KABUSHIKI KAISHA TOSHIBA
- HIROSHI OHNO
- G02 - OPTICS
Information Patent Application
SURFACE LIGHT SOURCE DEVICE
- Publication number 20140126237
- Publication date May 8, 2014
- KABUSHIKI KAISHA TOSHIBA
- Takeshi MORINO
- G02 - OPTICS
Information Patent Application
MICROWAVE ANNEALING APPARATUS AND METHOD OF MANUFACTURING A SEMICON...
- Publication number 20140073065
- Publication date Mar 13, 2014
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT GUIDE BODY AND SURFACE LIGHT SOURCE
- Publication number 20140049986
- Publication date Feb 20, 2014
- KABUSHIKI KAISHA TOSHIBA
- Yutaka NAKAI
- G02 - OPTICS
Information Patent Application
LIGHTING UNIT AND LIGHTING DEVICE
- Publication number 20130250577
- Publication date Sep 26, 2013
- Kabushiki Kaisha Toshiba
- Takayoshi MORIYAMA
- F21 - LIGHTING
Information Patent Application
LIGHTING UNIT AND LIGHTING DEVICE
- Publication number 20130250574
- Publication date Sep 26, 2013
- Kabushiki Kaisha Toshiba
- Takayoshi MORIYAMA
- F21 - LIGHTING
Information Patent Application
IMAGE SENSOR AND MANUFACTURING METHOD THEREOF
- Publication number 20130221474
- Publication date Aug 29, 2013
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- H01 - BASIC ELECTRIC ELEMENTS

Masataka Shiratsuchi

Person

Patents Grantslast 30 patents

Multi-charged particle beam irradiation apparatus and multi-charged...

Inspection apparatus and inspection method

Multiple electron beam inspection apparatus and multiple electron b...

Inspection method and inspection apparatus

Inspection device, inspection method, and storage medium

Multiple electron beam inspection apparatus and multiple electron b...

Pattern inspection method and pattern inspection apparatus

Pattern inspection apparatus and pattern inspection method

Electron beam inspection apparatus and electron beam inspection method

Pattern inspection apparatus and pattern inspection method

Electron beam inspection apparatus and electron beam inspection method

Thermal laser stimulation apparatus, method of thermally stimulatin...

Illumination device and light-guiding member

Charged particle beam inspection apparatus and charged particle bea...

LED lighting device

Image sensor and manufacturing method thereof

Microwave annealing apparatus and method of manufacturing a semicon...

Illuminating device

Light beam scanner

Lighting apparatus

Lighting apparatus with heat transfer and light guiding structure

Projector and portable terminal

Image sensor that includes a boundary region formed between a logic...

Lighting unit and lighting device

Image sensor including an image-sensing element region and logic ci...

Method and apparatus for deciding recording media based on light fr...

Surface light source device

Illumination apparatus and image reading apparatus including the same

Optical information recording/reproducing apparatus and method

Liquid crystal display and backlight module with tilting reflective...

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

MULTI-CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND MULTI-CHARGED...

INSPECTION APPARATUS AND INSPECTION METHOD

MULTIPLE ELECTRON BEAM INSPECTION APPARATUS AND MULTIPLE ELECTRON B...

MULTIPLE ELECTRON BEAM INSPECTION APPARATUS AND MULTIPLE ELECTRON B...

Electron Beam Inspection Apparatus and Electron Beam Inspection Method

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

ELECTRON BEAM INSPECTION APPARATUS AND ELECTRON BEAM INSPECTION METHOD

INSPECTION DEVICE, INSPECTION METHOD, AND STORAGE MEDIUM

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

INSPECTION METHOD AND INSPECTION APPARATUS

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

CHARGED PARTICLE BEAM INSPECTION APPARATUS AND CHARGED PARTICLE BEA...

THERMAL LASER STIMULATION APPARATUS, METHOD OF THERMALLY STIMULATIN...

ONE-SIDED EMISSION TYPE TRANSPARENT LIGHT GUIDE PLATE, AND SURFACE-...

Light Beam Scanner

IMAGE SENSOR AND MANUFACTURING METHOD THEREOF

LED LIGHTING DEVICE

Lighting Apparatus

PROJECTOR AND PORTABLE TERMINAL

ILLUMINATING DEVICE

ILLUMINATION DEVICE AND LIGHT-GUIDING MEMBER

SURFACE LIGHT SOURCE DEVICE

MICROWAVE ANNEALING APPARATUS AND METHOD OF MANUFACTURING A SEMICON...

LIGHT GUIDE BODY AND SURFACE LIGHT SOURCE

LIGHTING UNIT AND LIGHTING DEVICE

LIGHTING UNIT AND LIGHTING DEVICE

IMAGE SENSOR AND MANUFACTURING METHOD THEREOF