Masatake Hyoudou

Person

  • Ehime, JP

Patents Grantslast 30 patents

  • Information Patent Grant

    Analyzing apparatus

    • Patent number 8,289,529
    • Issue date Oct 16, 2012
    • Panasonic Corporation
    • Masatake Hyoudou
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ANALYZING APPARATUS

    • Publication number 20100309487
    • Publication date Dec 9, 2010
    • PANASONIC CORPORATION
    • Masatake Hyoudou
    • G01 - MEASURING TESTING