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Masatake Hyoudou
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Ehime, JP
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last 30 patents
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Patent Grant
Analyzing apparatus
Patent number
8,289,529
Issue date
Oct 16, 2012
Panasonic Corporation
Masatake Hyoudou
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
ANALYZING APPARATUS
Publication number
20100309487
Publication date
Dec 9, 2010
PANASONIC CORPORATION
Masatake Hyoudou
G01 - MEASURING TESTING