Masateru Doi

Follow

Person

Hirakata-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement probe
- Patent number 11,473,904
- Issue date Oct 18, 2022
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus and shape measuring method
- Patent number 8,006,402
- Issue date Aug 30, 2011
- Panasonic Corporation
- Keiichi Yoshizumi
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and method for thin board
- Patent number 7,178,393
- Issue date Feb 20, 2007
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe and using method for the same
- Patent number 7,065,893
- Issue date Jun 27, 2006
- Matsushita Electric Industrial Co., Ltd.
- Takaaki Kassai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for quantitative quality inspection of substra...
- Patent number 7,012,680
- Issue date Mar 14, 2006
- Matsushita Electric Industrial Co., Ltd.
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Grant
Configuration measuring method and apparatus for optically detectin...
- Patent number 5,616,916
- Issue date Apr 1, 1997
- Matsushita Electric Industrial Co., Ltd.
- Koji Handa
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT PROBE
- Publication number 20210123725
- Publication date Apr 29, 2021
- Panasonic Intellectual Property Management Co., Ltd.
- KEISHI KUBO
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD
- Publication number 20090299692
- Publication date Dec 3, 2009
- Keiichi YOSHIZUMI
- G01 - MEASURING TESTING
Information Patent Application
Measuring apparatus and method for thin board
- Publication number 20050223791
- Publication date Oct 13, 2005
- Keishi Kubo
- G01 - MEASURING TESTING
Information Patent Application
Measurement probe and using method for the same
- Publication number 20050204573
- Publication date Sep 22, 2005
- Takaaki Kassai
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for quantitative quality inspection of substra...
- Publication number 20040090639
- Publication date May 13, 2004
- Keishi Kubo
- G01 - MEASURING TESTING