Masato Ando

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Kami-niikawagun, JP

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Patents Grantslast 30 patents

Information Patent Grant
Force sensor
- Patent number D629320
- Issue date Dec 21, 2010
- Hokuriku Electric Industry Co., Ltd.
- Hiroyuki Sawamura
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Semiconductor Sensor
- Patent number 7,640,807
- Issue date Jan 5, 2010
- Hokuriku Electric Industry Co., Ltd.
- Masahide Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor force sensor
- Patent number 7,360,440
- Issue date Apr 22, 2008
- Hokuriku Electric Industry Co., Ltd.
- Shigeru Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor force sensor
- Patent number 7,234,359
- Issue date Jun 26, 2007
- Hokuriku Electric Industry Co., Ltd.
- Shigeru Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor acceleration sensor and process for manufacturing the...
- Patent number 7,122,396
- Issue date Oct 17, 2006
- Hokuriku Electric Industry Co., Ltd.
- Yoshiyuki Nakamizo
- G01 - MEASURING TESTING
Information Patent Grant
Acceleration detecting device
- Patent number 6,321,600
- Issue date Nov 27, 2001
- Hokuriku Electric Industry Co., Ltd.
- Shigeru Hirose
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR FORCE SENSOR
- Publication number 20070234827
- Publication date Oct 11, 2007
- HOKURIKU ELECTRIC INDUSTRY CO., LTD.
- Shigeru Hirose
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Sensor
- Publication number 20070234804
- Publication date Oct 11, 2007
- HOKURIKU ELECTRIC INDUSTRY CO., LTD.
- Masahide Tamura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor acceleration sensor and process for manufacturing the...
- Publication number 20060094148
- Publication date May 4, 2006
- Hokuriku Electric Industry Co., Ltd
- Yoshiyuki Nakamizo
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor force sensor
- Publication number 20050217386
- Publication date Oct 6, 2005
- Hokuriku Electric Industry Co.,
- Shigeru Hirose
- G01 - MEASURING TESTING