Masato Hamamoto

Person

Iruma, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 7,576,406
- Issue date Aug 18, 2009
- Hitachi, Ltd.
- Yoichi Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit
- Patent number 6,937,068
- Issue date Aug 30, 2005
- Hitachi, Ltd.
- Michiaki Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test method of semiconductor intergrated circuit and test pattern g...
- Patent number 6,922,803
- Issue date Jul 26, 2005
- Hitachi, Ltd.
- Michinobu Nakao
- G11 - INFORMATION STORAGE
Information Patent Grant
Manufacturing method of semiconductor device
- Patent number 6,670,201
- Issue date Dec 30, 2003
- Hitachi, Ltd.
- Masaki Kouno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and its fabrication method
- Patent number 6,636,075
- Issue date Oct 21, 2003
- Hitachi, Ltd.
- Michiaki Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit and its fabrication method
- Patent number 6,359,472
- Issue date Mar 19, 2002
- Hitachi, Ltd.
- Michiaki Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device and process for manufacturi...
- Patent number 6,194,915
- Issue date Feb 27, 2001
- Hitachi, Ltd.
- Michiaki Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device with a plurality of logic c...
- Patent number 5,298,802
- Issue date Mar 29, 1994
- Hitachi, Ltd.
- Mitsuo Usami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor integrated circuit device with a plurality of logic c...
- Patent number 5,283,480
- Issue date Feb 1, 1994
- Hitachi, Ltd.
- Mitsuo Usami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock feeding circuit and clock wiring system
- Patent number 5,140,184
- Issue date Aug 18, 1992
- Hitachi, Ltd.
- Masato Hamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated logic circuit
- Patent number 5,059,819
- Issue date Oct 22, 1991
- Hitachi, Ltd.
- Kazuo Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Integrated logic circuit having plural input cells and flip-flop an...
- Patent number 5,055,710
- Issue date Oct 8, 1991
- Hitachi, Ltd.
- Kazuo Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Wiring method of on-chip modification for an LSI
- Patent number 5,043,297
- Issue date Aug 27, 1991
- Hitachi, Ltd.
- Katsuyoshi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High speed TTL buffer circuit which is resistive to the influence o...
- Patent number 4,999,520
- Issue date Mar 12, 1991
- Hitachi, Ltd.
- Mitsuo Usami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
ECL flip-flop with improved x-ray resistant properties
- Patent number 4,940,905
- Issue date Jul 10, 1990
- Hitachi, Ltd.
- Tohru Kobayashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
ECL flip-flop with improved .alpha.-ray resistant properties
- Patent number 4,891,531
- Issue date Jan 2, 1990
- Hitachi, Ltd.
- Tohru Kobayashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Flip-flop circuit
- Patent number 4,868,420
- Issue date Sep 19, 1989
- Hitachi, Ltd.
- Hiroyuki Itoh
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device
- Publication number 20040183159
- Publication date Sep 23, 2004
- Hitachi, Ltd.
- Yoichi Tamaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit and its fabrication method
- Publication number 20040036497
- Publication date Feb 26, 2004
- Michiaki Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit and its fabrication method
- Publication number 20020070760
- Publication date Jun 13, 2002
- Michiaki Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test method of semiconductor intergrated circuit and test pattern g...
- Publication number 20020073373
- Publication date Jun 13, 2002
- Michinobu Nakao
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method of semiconductor device
- Publication number 20020036534
- Publication date Mar 28, 2002
- Hitachi, Ltd.
- Masaki Kouno
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and its fabrication method
- Publication number 20010009383
- Publication date Jul 26, 2001
- Michiaki Nakayama
- H01 - BASIC ELECTRIC ELEMENTS

Masato Hamamoto

Person

Patents Grantslast 30 patents

Semiconductor device

Semiconductor integrated circuit

Test method of semiconductor intergrated circuit and test pattern g...

Manufacturing method of semiconductor device

Semiconductor integrated circuit and its fabrication method

Semiconductor integrated circuit and its fabrication method

Semiconductor integrated circuit device and process for manufacturi...

Semiconductor integrated circuit device with a plurality of logic c...

Semiconductor integrated circuit device with a plurality of logic c...

Clock feeding circuit and clock wiring system

Integrated logic circuit

Integrated logic circuit having plural input cells and flip-flop an...

Wiring method of on-chip modification for an LSI

High speed TTL buffer circuit which is resistive to the influence o...

ECL flip-flop with improved x-ray resistant properties

ECL flip-flop with improved .alpha.-ray resistant properties

Flip-flop circuit

Patents Applicationslast 30 patents

Semiconductor device

Semiconductor integrated circuit and its fabrication method

Semiconductor integrated circuit and its fabrication method

Test method of semiconductor intergrated circuit and test pattern g...

Manufacturing method of semiconductor device

Semiconductor integrated circuit and its fabrication method