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Saitama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Device, method, and program for determining element, recording medi...
Patent number
8,203,347
Issue date
Jun 19, 2012
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Device, method, program, and recording medium for error factor dete...
Patent number
8,076,947
Issue date
Dec 13, 2011
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Network analyzer, network analyzing method, automatic corrector, co...
Patent number
7,652,482
Issue date
Jan 26, 2010
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Network analyzer, transmission tracking error measuring method, net...
Patent number
7,519,509
Issue date
Apr 14, 2009
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Fixture characteristic measuring device, method, program, recording...
Patent number
7,511,508
Issue date
Mar 31, 2009
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Information
Patent Grant
Error factor acquisition device, method, program, and recording medium
Patent number
7,348,784
Issue date
Mar 25, 2008
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Information
Patent Grant
Power supply device, method, program, recording medium, network ana...
Patent number
7,302,351
Issue date
Nov 27, 2007
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEVICE, METHOD, PROGRAM, AND RECORDING MEDIUM FOR ERROR FACTOR DETE...
Publication number
20100225301
Publication date
Sep 9, 2010
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
DEVICE, METHOD, AND PROGRAM FOR DETERMINING ELEMENT, RECORDING MEDI...
Publication number
20100042347
Publication date
Feb 18, 2010
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Network Analyzer, Transmission Tracking Error Measuring Method, Net...
Publication number
20070285108
Publication date
Dec 13, 2007
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Fixture Characteristic Measuring Device, Method, Program, Recording...
Publication number
20070222455
Publication date
Sep 27, 2007
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Information
Patent Application
Error factor acquisition device, method, program, and recording medium
Publication number
20070029989
Publication date
Feb 8, 2007
Advantest Corporation
Masato Haruta
G01 - MEASURING TESTING
Information
Patent Application
Network analyzer, network analyzing method, automatic corrector, co...
Publication number
20060005065
Publication date
Jan 5, 2006
Advantest Corporation
Yoshikazu Nakayama
G01 - MEASURING TESTING
Information
Patent Application
Power supply device, method, program, recording medium, network ana...
Publication number
20050289392
Publication date
Dec 29, 2005
Masato Haruta
H03 - BASIC ELECTRONIC CIRCUITRY