Masato Hirade

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and scanning probe microscope optical axi...
- Patent number 11,519,936
- Issue date Dec 6, 2022
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis device
- Patent number 11,499,989
- Issue date Nov 15, 2022
- Shimadzu Corporation
- Kanji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning type probe microscope and control device for scanning type...
- Patent number 11,454,647
- Issue date Sep 27, 2022
- Shimadzu Corporation
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and analysis method
- Patent number 11,415,596
- Issue date Aug 16, 2022
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzer
- Patent number 11,162,975
- Issue date Nov 2, 2021
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with case and elastic body
- Patent number 11,073,535
- Issue date Jul 27, 2021
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Data correction method, computer program for causing computer to pe...
- Patent number 10,846,547
- Issue date Nov 24, 2020
- Shimadzu Corporation
- Masato Hirade
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,641,790
- Issue date May 5, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and light intensity adjusting method
- Patent number 10,598,691
- Issue date Mar 24, 2020
- SHIMADZU CORPORATION
- Kazuma Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope using gradual increases and decreases in...
- Patent number 10,564,180
- Issue date Feb 18, 2020
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and surface image correction method
- Patent number 10,564,183
- Issue date Feb 18, 2020
- Shimadzu Corporation
- Masato Hirade
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,254,307
- Issue date Apr 9, 2019
- Shimadzu Corporation
- Kanji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,168,354
- Issue date Jan 1, 2019
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,088,499
- Issue date Oct 2, 2018
- Shimadzu Corporation
- Kanji Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 9,689,892
- Issue date Jun 27, 2017
- SHIMADZU CORPORATION
- Masato Hirade
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...
- Publication number 20220358636
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER
- Publication number 20220357359
- Publication date Nov 10, 2022
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE OPTICAL AXI...
- Publication number 20220018873
- Publication date Jan 20, 2022
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Application
SURFACE ANALYSIS DEVICE
- Publication number 20210349125
- Publication date Nov 11, 2021
- Shimadzu Corporation
- Kanji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...
- Publication number 20210311091
- Publication date Oct 7, 2021
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND ANALYSIS METHOD
- Publication number 20210055326
- Publication date Feb 25, 2021
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope
- Publication number 20200341027
- Publication date Oct 29, 2020
- Shimadzu Corporation
- Masato HIRADE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD
- Publication number 20190331711
- Publication date Oct 31, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190324053
- Publication date Oct 24, 2019
- Shimadzu Corporation
- Kazuma WATANABE
- G01 - MEASURING TESTING
Information Patent Application
DATA CORRECTION METHOD, COMPUTER PROGRAM FOR CAUSING COMPUTER TO PE...
- Publication number 20190294905
- Publication date Sep 26, 2019
- Shimadzu Corporation
- Masato HIRADE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SURFACE IMAGE CORRECTION METHOD
- Publication number 20190277882
- Publication date Sep 12, 2019
- Shimadzu Corporation
- Masato HIRADE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20180259552
- Publication date Sep 13, 2018
- Shimadzu Corporation
- Kanji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20180106832
- Publication date Apr 19, 2018
- Shimadzu Corporation
- Kanji KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20180088148
- Publication date Mar 29, 2018
- Shimadzu Corporation
- Masato HIRADE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20170131324
- Publication date May 11, 2017
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING

Masato Hirade

Person

Patents Grantslast 30 patents

Scanning probe microscope and scanning probe microscope optical axi...

Surface analysis device

Scanning type probe microscope and control device for scanning type...

Scanning probe microscope and analysis method

Surface analyzer

Scanning probe microscope with case and elastic body

Data correction method, computer program for causing computer to pe...

Scanning probe microscope

Scanning probe microscope and light intensity adjusting method

Scanning probe microscope using gradual increases and decreases in...

Scanning probe microscope and surface image correction method

Scanning probe microscope

Scanning probe microscope

Scanning probe microscope

Scanning probe microscope

Patents Applicationslast 30 patents

ANALYZER, DISPLAY CONTROL METHOD, AND RECORDING MEDIUM STORING DISP...

INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER

SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPE OPTICAL AXI...

SURFACE ANALYSIS DEVICE

SCANNING TYPE PROBE MICROSCOPE AND CONTROL DEVICE FOR SCANNING TYPE...

SCANNING PROBE MICROSCOPE AND ANALYSIS METHOD

Scanning Probe Microscope

SCANNING PROBE MICROSCOPE AND LIGHT INTENSITY ADJUSTING METHOD

SCANNING PROBE MICROSCOPE

DATA CORRECTION METHOD, COMPUTER PROGRAM FOR CAUSING COMPUTER TO PE...

SCANNING PROBE MICROSCOPE AND SURFACE IMAGE CORRECTION METHOD

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE