Masato Hosaka

Person

Kumamoto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Substrate inspection device, substrate inspection method, and stora...
- Patent number 12,148,147
- Issue date Nov 19, 2024
- Tokyo Electron Limited
- Masashi Enomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Estimation model creation device, estimation model creation method,...
- Patent number 12,051,189
- Issue date Jul 30, 2024
- Tokyo Electron Limited
- Toyohisa Tsuruda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection apparatus, substrate processing apparatus, sub...
- Patent number 11,823,922
- Issue date Nov 21, 2023
- Tokyo Electron Limited
- Akiko Kiyotomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing method, information processing apparatus and...
- Patent number 11,636,579
- Issue date Apr 25, 2023
- Tokyo Electron Limited
- Toyohisa Tsuruda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate inspection apparatus, substrate processing apparatus, sub...
- Patent number 11,609,502
- Issue date Mar 21, 2023
- Tokyo Electron Limited
- Akiko Kiyotomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape characteristic value estimation apparatus, shape characterist...
- Patent number 11,544,864
- Issue date Jan 3, 2023
- Tokyo Electron Limited
- Toyohisa Tsuruda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate processing apparatus, substrate processing method and rec...
- Patent number 10,937,673
- Issue date Mar 2, 2021
- Tokyo Electron Limited
- Madoka Fujimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate processing apparatus
- Patent number 10,707,109
- Issue date Jul 7, 2020
- Tokyo Electron Limited
- Satoshi Morita
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SHAPE CHARACTERISTIC VALUE ESTIMATION APPARATUS, SHAPE CHARACTERIST...
- Publication number 20240404042
- Publication date Dec 5, 2024
- TOKYO ELECTRON LIMITED
- Toyohisa TSURUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESTIMATION MODEL CREATION DEVICE, ESTIMATION MODEL CREATION METHOD,...
- Publication number 20240338809
- Publication date Oct 10, 2024
- TOKYO ELECTRON LIMITED
- Toyohisa TSURUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS, SUBSTRATE PROCESSING APPARATUS, SUB...
- Publication number 20230197480
- Publication date Jun 22, 2023
- TOKYO ELECTRON LIMITED
- Akiko Kiyotomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION DEVICE, SUBSTRATE INSPECTION METHOD, AND STORA...
- Publication number 20220398708
- Publication date Dec 15, 2022
- TOKYO ELECTRON LIMITED
- Masashi ENOMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESTIMATION MODEL CREATION DEVICE, ESTIMATION MODEL CREATION METHOD,...
- Publication number 20220207711
- Publication date Jun 30, 2022
- TOKYO ELECTRON LIMITED
- Toyohisa TSURUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING APPARATUS AND...
- Publication number 20210256666
- Publication date Aug 19, 2021
- TOKYO ELECTRON LIMITED
- Toyohisa TSURUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE CHARACTERISTIC VALUE ESTIMATION APPARATUS, SHAPE CHARACTERIST...
- Publication number 20210201516
- Publication date Jul 1, 2021
- TOKYO ELECTRON LIMITED
- Toyohisa TSURUDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS, SUBSTRATE PROCESSING APPARATUS, SUB...
- Publication number 20200285156
- Publication date Sep 10, 2020
- TOKYO ELECTRON LIMITED
- Akiko Kiyotomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD AND REC...
- Publication number 20190189475
- Publication date Jun 20, 2019
- TOKYO ELECTRON LIMITED
- Madoka Fujimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING APPARATUS
- Publication number 20190096730
- Publication date Mar 28, 2019
- TOKYO ELECTRON LIMITED
- Satoshi Morita
- G06 - COMPUTING CALCULATING COUNTING

Masato Hosaka

Person

Patents Grantslast 30 patents

Substrate inspection device, substrate inspection method, and stora...

Estimation model creation device, estimation model creation method,...

Substrate inspection apparatus, substrate processing apparatus, sub...

Information processing method, information processing apparatus and...

Substrate inspection apparatus, substrate processing apparatus, sub...

Shape characteristic value estimation apparatus, shape characterist...

Substrate processing apparatus, substrate processing method and rec...

Substrate processing apparatus

Patents Applicationslast 30 patents

SHAPE CHARACTERISTIC VALUE ESTIMATION APPARATUS, SHAPE CHARACTERIST...

ESTIMATION MODEL CREATION DEVICE, ESTIMATION MODEL CREATION METHOD,...

SUBSTRATE INSPECTION APPARATUS, SUBSTRATE PROCESSING APPARATUS, SUB...

SUBSTRATE INSPECTION DEVICE, SUBSTRATE INSPECTION METHOD, AND STORA...

ESTIMATION MODEL CREATION DEVICE, ESTIMATION MODEL CREATION METHOD,...

INFORMATION PROCESSING METHOD, INFORMATION PROCESSING APPARATUS AND...

SHAPE CHARACTERISTIC VALUE ESTIMATION APPARATUS, SHAPE CHARACTERIST...

SUBSTRATE INSPECTION APPARATUS, SUBSTRATE PROCESSING APPARATUS, SUB...

SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD AND REC...

SUBSTRATE PROCESSING APPARATUS