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Masato Iyoki
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Chiba, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Cantilever for scanning probe microscope and scanning probe microsc...
Patent number
8,601,608
Issue date
Dec 3, 2013
Japan Science and Technology Agency
Kenichi Maruyama
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Cantilever, cantilever system, scanning probe microscope, mass sens...
Patent number
8,214,915
Issue date
Jul 3, 2012
SII NanoTechnology Inc.
Masatsugu Shigeno
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Self displacement sensing cantilever and scanning probe microscope
Patent number
8,161,568
Issue date
Apr 17, 2012
SII NanoTechnology Inc.
Masato Iyoki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Piezoelectric actuator provided with a displacement meter, piezoele...
Patent number
8,115,367
Issue date
Feb 14, 2012
SII NanoTechnology Inc.
Masato Iyoki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Circular cylinder type piezoelectric actuator and piezoelectric ele...
Patent number
8,058,780
Issue date
Nov 15, 2011
SII NanoTechnology Inc.
Masato Iyoki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Approach method for probe and sample in scanning probe microscope
Patent number
8,024,816
Issue date
Sep 20, 2011
SII NanoTechnology Inc.
Masato Iyoki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Optical displacement detection mechanism and surface information me...
Patent number
7,973,942
Issue date
Jul 5, 2011
SII Nano Technology Inc.
Masato Iyoki
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Sensor for observations in liquid environments and observation appa...
Patent number
7,945,965
Issue date
May 17, 2011
SII NanoTechnology Inc.
Naoya Watanabe
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Optical displacement-detecting mechanism and probe microscope using...
Patent number
7,787,133
Issue date
Aug 31, 2010
SII NanoTechnology Inc.
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope fine-movement mechanism and scanning prob...
Patent number
7,614,288
Issue date
Nov 10, 2009
Sii Nano Technology Inc.
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope displacement detecting mechanism and scan...
Patent number
7,614,287
Issue date
Nov 10, 2009
SII NanoTechnology Inc.
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Grant
Vibration-type cantilever holder and scanning probe microscope
Patent number
7,605,368
Issue date
Oct 20, 2009
SII NanoTechnology Inc.
Masatsugu Shigeno
G01 - MEASURING TESTING
Information
Patent Grant
Fine-adjustment mechanism for scanning probe microscopy
Patent number
7,288,762
Issue date
Oct 30, 2007
SII NanoTechnology Inc.
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing light-propagating probe for near-field micr...
Patent number
7,282,157
Issue date
Oct 16, 2007
SII NanoTechnology Inc.
Norio Chiba
G01 - MEASURING TESTING
Information
Patent Grant
Probe for near-field microscope, the method for manufacturing the p...
Patent number
7,241,987
Issue date
Jul 10, 2007
Riken
Yuika Saito
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscopy cantilever holder and scanning probe micr...
Patent number
7,170,054
Issue date
Jan 30, 2007
SII NanoTechnology Inc.
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope having piezoelectric member for controlli...
Patent number
6,257,053
Issue date
Jul 10, 2001
Seiko Instruments Inc.
Eisuke Tomita
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
APPROACH METHOD FOR PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPE
Publication number
20100205697
Publication date
Aug 12, 2010
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
Cantilever for Scanning Probe Microscope and Scanning Probe Microsc...
Publication number
20100154085
Publication date
Jun 17, 2010
Kenichi Maruyama
G01 - MEASURING TESTING
Information
Patent Application
Self displacement sensing cantilever and scanning probe microscope
Publication number
20100132075
Publication date
May 27, 2010
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
Cantilever, cantilever system, scanning probe microscope, mass sens...
Publication number
20100107284
Publication date
Apr 29, 2010
Masatsugu Shigeno
G01 - MEASURING TESTING
Information
Patent Application
SENSOR FOR OBSERVATIONS IN LIQUID ENVIRONMENTS AND OBSERVATION APPA...
Publication number
20090265819
Publication date
Oct 22, 2009
Naoya Watanabe
G01 - MEASURING TESTING
Information
Patent Application
Circular cylinder type piezoelectric actuator and piezoelectric ele...
Publication number
20090206707
Publication date
Aug 20, 2009
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
PIEZOELECTRIC ACTUATOR PROVIDED WITH A DISPLACEMENT METER, PIEZOELE...
Publication number
20090189485
Publication date
Jul 30, 2009
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
Scanning Probe Microscope Fine-Movement Mechanism and Scanning Prob...
Publication number
20080061232
Publication date
Mar 13, 2008
SII NANO TECHNOLOGY INC.
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
SCANNING PROBE MICROSCOPE DISPLACEMENT DETECTING MECHANISM AND SCAN...
Publication number
20080048115
Publication date
Feb 28, 2008
SII NANO TECHNOLOGY INC.
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
Optical Displacement Detection Mechanism and Surface Information Me...
Publication number
20080049236
Publication date
Feb 28, 2008
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DISPLACEMENT-DETECTING MECHANISM AND PROBE MICROSCOPE USING...
Publication number
20080049223
Publication date
Feb 28, 2008
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
Vibration-type cantilever holder and scanning probe microscope
Publication number
20070104079
Publication date
May 10, 2007
Masatsugu Shigeno
G01 - MEASURING TESTING
Information
Patent Application
Probe for near-field microscope, the method for manufacturing the p...
Publication number
20060043276
Publication date
Mar 2, 2006
Yuika Saito
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscopy cantilever holder and scanning probe micr...
Publication number
20060043290
Publication date
Mar 2, 2006
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
Fine-adjustment mechanism for scanning probe microscopy
Publication number
20050231066
Publication date
Oct 20, 2005
Masato Iyoki
G01 - MEASURING TESTING
Information
Patent Application
Method of manufacturing light-propagating probe for near-field micr...
Publication number
20040126073
Publication date
Jul 1, 2004
Norio Chiba
G02 - OPTICS