Masato Kamio

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and image processing method in charged...
- Patent number 10,763,078
- Issue date Sep 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Masato Kamio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device and image processing method in charged...
- Patent number 10,522,325
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Masato Kamio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device and method for correcting detected sig...
- Patent number 8,848,049
- Issue date Sep 30, 2014
- Hitachi High-Technologies Corporation
- Masato Kamio
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device and Scan Waveform Generation Method
- Publication number 20230260739
- Publication date Aug 17, 2023
- Hitachi High-Tech Corporation
- Keisuke TANUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20220415609
- Publication date Dec 29, 2022
- Hitachi High-Tech Corporation
- Takumi UEZONO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20200066484
- Publication date Feb 27, 2020
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20180301316
- Publication date Oct 18, 2018
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING DETECTED SIG...
- Publication number 20130278745
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Masato Kamio
- H01 - BASIC ELECTRIC ELEMENTS