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Masato Kishi
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Tokyo, JP
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last 30 patents
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Patent Grant
Magnetic field measuring apparatus capable of measuring at high spa...
Patent number
7,385,393
Issue date
Jun 10, 2008
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
MAGNETIC FIELD MEASURING APPARATUS CAPABLE OF MEASURING AT HIGH SPA...
Publication number
20080238419
Publication date
Oct 2, 2008
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING
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Patent Application
Magnetic field measuring apparatus capable of measuring at high spa...
Publication number
20050190358
Publication date
Sep 1, 2005
NEC Corporation
Mizuki Iwanami
G01 - MEASURING TESTING