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Masato NAKA
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Yokohama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection method and inspection apparatus
Patent number
11,978,195
Issue date
May 7, 2024
Kioxia Corporation
Keisuke Chiba
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Substrate production method, substrate processing apparatus, and su...
Patent number
10,486,203
Issue date
Nov 26, 2019
TOSHIBA MEMORY CORPORATION
Hideaki Sakurai
B08 - CLEANING
Information
Patent Grant
Inspection apparatus
Patent number
9,728,374
Issue date
Aug 8, 2017
Ebara Corporation
Takehide Hayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection apparatus
Patent number
9,368,322
Issue date
Jun 14, 2016
Ebara Corporation
Takehide Hayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mask inspection apparatus and mask inspection method
Patent number
8,669,522
Issue date
Mar 11, 2014
Kabushiki Kaisha Toshiba
Shinji Yamaguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
Publication number
20220230289
Publication date
Jul 21, 2022
KIOXIA Corporation
Keisuke CHIBA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ORIGINAL PLATE MANUFACTURING METHOD, DRAWING DATA CREATION METHOD,...
Publication number
20220035243
Publication date
Feb 3, 2022
KIOXIA Corporation
Ryoji YOSHIKAWA
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
SUBSTRATE PRODUCTION METHOD, SUBSTRATE PROCESSING APPARATUS, AND SU...
Publication number
20170274427
Publication date
Sep 28, 2017
Kabushiki Kaisha Toshiba
Hideaki SAKURAI
B08 - CLEANING
Information
Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND IMAGE PROCESSING PROGRAM
Publication number
20170069087
Publication date
Mar 9, 2017
Kabushiki Kaisha Toshiba
Masato Naka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION APPARATUS
Publication number
20160322192
Publication date
Nov 3, 2016
EBARA CORPORATION
Takehide HAYASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Reflective Photomask, Method for Inspecting Same and Mask Blank
Publication number
20160266058
Publication date
Sep 15, 2016
Kabushiki Kaisha Toshiba
Masato NAKA
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS
Publication number
20150287570
Publication date
Oct 8, 2015
EBARA CORPORATION
Takehide HAYASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD
Publication number
20120241645
Publication date
Sep 27, 2012
Shinji YAMAGUCHI
G01 - MEASURING TESTING