Masato Onda

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Kawasaki Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Common test board, IP evaluation board, and semiconductor device te...
- Patent number 10,718,789
- Issue date Jul 21, 2020
- Kabushiki Kaisha Toshiba
- Masato Onda
- G01 - MEASURING TESTING
Information Patent Grant
Common test board, IP evaluation board, and semiconductor device te...
- Patent number 10,101,359
- Issue date Oct 16, 2018
- Kabushiki Kaisha Toshiba
- Masato Onda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMMON TEST BOARD, IP EVALUATION BOARD, AND SEMICONDUCTOR DEVICE TE...
- Publication number 20190004088
- Publication date Jan 3, 2019
- Kabushiki Kaisha Toshiba
- Masato Onda
- G01 - MEASURING TESTING
Information Patent Application
COMMON TEST BOARD, IP EVALUATION BOARD, AND SEMICONDUCTOR DEVICE TE...
- Publication number 20160266167
- Publication date Sep 15, 2016
- Kabushiki Kaisha Toshiba
- Masato Onda
- G01 - MEASURING TESTING