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MASATO TAKEYABU
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SAPPORO-SHI, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Low power circuit with proper slew rate by automatic adjustment of...
Patent number
RE40168
Issue date
Mar 25, 2008
Fujitsu Limited
Hiromi Nanba
327 - Miscellaneous active electrical nonlinear devices, circuits, and systems
Information
Patent Grant
Signal transmitting apparatus
Patent number
6,775,524
Issue date
Aug 10, 2004
Fujitsu Limited
Masato Takeyabu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Analog/digital converter with error automatic calibration function
Patent number
6,642,871
Issue date
Nov 4, 2003
Fujitsu Limited
Masato Takeyabu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Low power circuit with proper slew rate by automatic adjustment of...
Patent number
6,535,039
Issue date
Mar 18, 2003
Fujitsu Limited
Hiromi Nanba
G11 - INFORMATION STORAGE
Information
Patent Grant
Frequency comparator and clock regenerating device using the same
Patent number
6,392,494
Issue date
May 21, 2002
Fujitsu Limited
Masato Takeyabu
G01 - MEASURING TESTING
Information
Patent Grant
Transmission-line loss equalizing circuit
Patent number
6,011,435
Issue date
Jan 4, 2000
Fujitsu Limited
Masato Takeyabu
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
ANALOG/DIGITAL CONVERTER WITH ERROR AUTOMATIC CALIBRATION FUNCTION
Publication number
20030184466
Publication date
Oct 2, 2003
Masato Takeyabu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Signal transmitting apparatus
Publication number
20020137482
Publication date
Sep 26, 2002
Masato Takeyabu
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Low power circuit with proper slew rate by automatic adjustment of...
Publication number
20020063590
Publication date
May 30, 2002
FUJITSU LIMITED
Hiromi Nanba
G11 - INFORMATION STORAGE
Information
Patent Application
FREQUENCY COMPARATOR AND CLOCK REGENERATING DEVICE USING THE SAME
Publication number
20010045868
Publication date
Nov 29, 2001
MASATO TAKEYABU
G01 - MEASURING TESTING