Masatoshi HIRONO

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmitting device, receiving device, and quantum key distribution...
- Patent number 11,387,992
- Issue date Jul 12, 2022
- Kabushiki Kaisha Toshiba
- Masakazu Kikawada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distance measuring device and distance measuring method
- Patent number 10,816,663
- Issue date Oct 27, 2020
- Kabushiki Kaisha Toshiba
- Yutaka Ota
- G01 - MEASURING TESTING
Information Patent Grant
Quantum communication system, transmitting apparatus, and receiving...
- Patent number 10,630,392
- Issue date Apr 21, 2020
- Kabushiki Kaisha Toshiba
- Masakazu Kikawada
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 10,410,335
- Issue date Sep 10, 2019
- NuFlare Technology, Inc.
- Riki Ogawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus
- Patent number 10,197,507
- Issue date Feb 5, 2019
- NuFlare Technology, Inc.
- Riki Ogawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 10,007,980
- Issue date Jun 26, 2018
- NuFlare Technology, Inc.
- Riki Ogawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 9,846,928
- Issue date Dec 19, 2017
- NuFlare Technology, Inc.
- Riki Ogawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
LED lighting device
- Patent number 9,746,140
- Issue date Aug 29, 2017
- Kabushiki Kaisha Toshiba
- Hiroshi Ohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection device
- Patent number 9,683,947
- Issue date Jun 20, 2017
- NuFlare Technology, Inc.
- Masatoshi Hirono
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Light beam scanner
- Patent number 9,436,001
- Issue date Sep 6, 2016
- Kabushiki Kaisha Toshiba
- Masataka Shiratsuchi
- G02 - OPTICS
Information Patent Grant
Projector and portable terminal
- Patent number 9,372,389
- Issue date Jun 21, 2016
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pattern test apparatus
- Patent number 9,157,870
- Issue date Oct 13, 2015
- Nuflare Technology, Inc.
- Riki Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Photomask inspection method
- Patent number 8,229,206
- Issue date Jul 24, 2012
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic focus adjusting mechanism and optical image acquisition a...
- Patent number 8,004,655
- Issue date Aug 23, 2011
- Kabushiki Kaisha Toshiba
- Masataka Shiratsuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask blank for EUV exposure and mask for EUV exposure
- Patent number 7,935,460
- Issue date May 3, 2011
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Lighting optical apparatus and sample inspection apparatus
- Patent number 7,863,588
- Issue date Jan 4, 2011
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G01 - MEASURING TESTING
Information Patent Grant
Optical quantizing unit and optical A/D converter
- Patent number 7,671,771
- Issue date Mar 2, 2010
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G02 - OPTICS
Information Patent Grant
Lighting system having lenses for light sources emitting rays at di...
- Patent number 7,648,256
- Issue date Jan 19, 2010
- Kabushiki Kaisha Toshiba
- Masataka Shiratsuchi
- F21 - LIGHTING
Information Patent Grant
Optical quantizing unit and optical A/D converter
- Patent number 7,403,142
- Issue date Jul 22, 2008
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G02 - OPTICS
Information Patent Grant
Optical quantizing unit and optical A/D converter
- Patent number 7,403,143
- Issue date Jul 22, 2008
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G02 - OPTICS
Information Patent Grant
Optical recording/reproducing apparatus
- Patent number 5,946,282
- Issue date Aug 31, 1999
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SENSING SYSTEMS AND REFLECTIVE OPTICAL ELEMENT
- Publication number 20240264076
- Publication date Aug 8, 2024
- Kabushiki Kaisha Toshiba
- Shinji SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS DETECTION DEVICE
- Publication number 20230296504
- Publication date Sep 21, 2023
- Kabushiki Kaisha Toshiba
- Masatoshi HIRONO
- G01 - MEASURING TESTING
Information Patent Application
LiDAR DEVICE AND CONTROL METHOD FOR LiDAR DEVICE
- Publication number 20230296733
- Publication date Sep 21, 2023
- Kabushiki Kaisha Toshiba
- Masatoshi HIRONO
- G01 - MEASURING TESTING
Information Patent Application
LIDAR SYSTEM
- Publication number 20220107397
- Publication date Apr 7, 2022
- Kabushiki Kaisha Toshiba
- Masatoshi HIRONO
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASUREMENT DEVICE
- Publication number 20220065998
- Publication date Mar 3, 2022
- Kabushiki Kaisha Toshiba
- Masatoshi HIRONO
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM COMMUNICATION SYSTEM, TRANSMITTING APPARATUS, AND RECEIVING...
- Publication number 20200067601
- Publication date Feb 27, 2020
- KABUSHIKI KAISHA TOSHIBA
- Masakazu KIKAWADA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TRANSMITTING DEVICE, RECEIVING DEVICE, AND QUANTUM KEY DISTRIBUTION...
- Publication number 20190222415
- Publication date Jul 18, 2019
- KABUSHIKI KAISHA TOSHIBA
- Masakazu KIKAWADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20180293724
- Publication date Oct 11, 2018
- NuFlare Technology, Inc.
- Riki OGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISTANCE MEASURING DEVICE AND DISTANCE MEASURING METHOD
- Publication number 20180128918
- Publication date May 10, 2018
- Kabushiki Kaisha Toshiba
- Yutaka OTA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20180075595
- Publication date Mar 15, 2018
- NuFlare Technology, Inc.
- Riki OGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION DEVICE
- Publication number 20160209333
- Publication date Jul 21, 2016
- NuFlare Technology, Inc.
- Masatoshi HIRONO
- G01 - MEASURING TESTING
Information Patent Application
Light Beam Scanner
- Publication number 20150378150
- Publication date Dec 31, 2015
- Kabushiki Kaisha Toshiba
- Masataka SHIRATSUCHI
- G02 - OPTICS
Information Patent Application
PATTERN TEST APPARATUS
- Publication number 20150377800
- Publication date Dec 31, 2015
- NuFlare Technology, Inc.
- Riki OGAWA
- G01 - MEASURING TESTING
Information Patent Application
LED LIGHTING DEVICE
- Publication number 20150192258
- Publication date Jul 9, 2015
- Toshiba Materials Co., Ltd.
- Hiroshi Ohno
- F21 - LIGHTING
Information Patent Application
PROJECTOR AND PORTABLE TERMINAL
- Publication number 20140333906
- Publication date Nov 13, 2014
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G02 - OPTICS
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20140232849
- Publication date Aug 21, 2014
- NuFlare Technology, Inc.
- Riki OGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20140204202
- Publication date Jul 24, 2014
- NuFlare Technology, Inc.
- Riki OGAWA
- B82 - NANO-TECHNOLOGY
Information Patent Application
PATTERN TEST APPARATUS
- Publication number 20140055780
- Publication date Feb 27, 2014
- KABUSHIKI KAISHA TOSHIBA
- Riki OGAWA
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS
- Publication number 20120081538
- Publication date Apr 5, 2012
- Kabushiki Kaisha Toshiba
- Riki Ogawa
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC FOCUS ADJUSTING MECHANISM AND OPTICAL IMAGE ACQUISITION A...
- Publication number 20100247085
- Publication date Sep 30, 2010
- Kabushiki Kaisha Toshiba
- Masataka Shiratsuchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PHOTOMASK INSPECTION METHOD
- Publication number 20100074512
- Publication date Mar 25, 2010
- Advanced Mask Inspection Technology, Inc.
- Masatoshi HIRONO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK BLANK FOR EUV EXPOSURE AND MASK FOR EUV EXPOSURE
- Publication number 20090075184
- Publication date Mar 19, 2009
- Advanced Mask Inspection Technology Inc.
- Masatoshi HIRONO
- B82 - NANO-TECHNOLOGY
Information Patent Application
Optical quantizing unit and optical a/d converter
- Publication number 20080297391
- Publication date Dec 4, 2008
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G02 - OPTICS
Information Patent Application
Optical quantizing unit and optical A/D converter
- Publication number 20080266154
- Publication date Oct 30, 2008
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G02 - OPTICS
Information Patent Application
LIGHTING OPTICAL APPARATUS AND SAMPLE INSPECTION APPARATUS
- Publication number 20080237489
- Publication date Oct 2, 2008
- Advanced Mask Inspection Technology Inc.
- Masatoshi HIRONO
- G02 - OPTICS
Information Patent Application
MASK PATTERN INSPECTION APPARATUS WITH KOEHLER ILLUMINATION SYSTEM...
- Publication number 20080204737
- Publication date Aug 28, 2008
- Advanced Mask Inspection Technology Inc.
- Riki OGAWA
- G01 - MEASURING TESTING
Information Patent Application
Optical quantizing unit and optical A/D converter
- Publication number 20080094263
- Publication date Apr 24, 2008
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G02 - OPTICS
Information Patent Application
OPTICAL-PICKUP HEAD DEVICE, AND METHOD AND APPARATUS FOR REPRODUCIN...
- Publication number 20070201324
- Publication date Aug 30, 2007
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G11 - INFORMATION STORAGE
Information Patent Application
Optical quantizing unit and optical A/D converter
- Publication number 20070166044
- Publication date Jul 19, 2007
- Masatoshi Hirono
- G02 - OPTICS
Information Patent Application
LIGHTING SYSTEM
- Publication number 20070147041
- Publication date Jun 28, 2007
- Kabushiki Kaisha Toshiba
- Masataka Shiratsuchi
- G02 - OPTICS

Masatoshi HIRONO

Person

Patents Grantslast 30 patents

Transmitting device, receiving device, and quantum key distribution...

Distance measuring device and distance measuring method

Quantum communication system, transmitting apparatus, and receiving...

Inspection method and inspection apparatus

Inspection apparatus

Inspection method and inspection apparatus

Inspection method and inspection apparatus

LED lighting device

Defect inspection device

Light beam scanner

Projector and portable terminal

Pattern test apparatus

Photomask inspection method

Automatic focus adjusting mechanism and optical image acquisition a...

Mask blank for EUV exposure and mask for EUV exposure

Lighting optical apparatus and sample inspection apparatus

Optical quantizing unit and optical A/D converter

Lighting system having lenses for light sources emitting rays at di...

Optical quantizing unit and optical A/D converter

Optical quantizing unit and optical A/D converter

Optical recording/reproducing apparatus

Patents Applicationslast 30 patents

SENSING SYSTEMS AND REFLECTIVE OPTICAL ELEMENT

GAS DETECTION DEVICE

LiDAR DEVICE AND CONTROL METHOD FOR LiDAR DEVICE

LIDAR SYSTEM

DISTANCE MEASUREMENT DEVICE

QUANTUM COMMUNICATION SYSTEM, TRANSMITTING APPARATUS, AND RECEIVING...

TRANSMITTING DEVICE, RECEIVING DEVICE, AND QUANTUM KEY DISTRIBUTION...

INSPECTION METHOD AND INSPECTION APPARATUS

DISTANCE MEASURING DEVICE AND DISTANCE MEASURING METHOD

INSPECTION METHOD AND INSPECTION APPARATUS

DEFECT INSPECTION DEVICE

Light Beam Scanner

PATTERN TEST APPARATUS

LED LIGHTING DEVICE

PROJECTOR AND PORTABLE TERMINAL

INSPECTION METHOD AND INSPECTION APPARATUS

INSPECTION APPARATUS

PATTERN TEST APPARATUS

PATTERN INSPECTION APPARATUS

AUTOMATIC FOCUS ADJUSTING MECHANISM AND OPTICAL IMAGE ACQUISITION A...

PHOTOMASK INSPECTION METHOD

MASK BLANK FOR EUV EXPOSURE AND MASK FOR EUV EXPOSURE

Optical quantizing unit and optical a/d converter

Optical quantizing unit and optical A/D converter

LIGHTING OPTICAL APPARATUS AND SAMPLE INSPECTION APPARATUS

MASK PATTERN INSPECTION APPARATUS WITH KOEHLER ILLUMINATION SYSTEM...

Optical quantizing unit and optical A/D converter

OPTICAL-PICKUP HEAD DEVICE, AND METHOD AND APPARATUS FOR REPRODUCIN...

Optical quantizing unit and optical A/D converter

LIGHTING SYSTEM