Masatoshi Hizuka

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Saitama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Speckle interferometer apparatus
- Patent number 7,092,104
- Issue date Aug 15, 2006
- Fujinon Corporation
- Masatoshi Hizuka
- G01 - MEASURING TESTING
Information Patent Grant
Oblique incidence interferometer with fringe scan drive
- Patent number 5,786,896
- Issue date Jul 28, 1998
- Fuji Photo Optical Co., Ltd.
- Masatoshi Hizuka
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for testing forms of surface and stress and strain
- Patent number 5,694,217
- Issue date Dec 2, 1997
- Fuji Photo Optical Co., Ltd.
- Masatoshi Hizuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Speckle interferometer apparatus
- Publication number 20040179204
- Publication date Sep 16, 2004
- Fuji Photo Optical Co., Ltd.
- Masatoshi Hizuka
- G01 - MEASURING TESTING