Masatoshi Kawashima

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Hamura, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 8,618,823
- Issue date Dec 31, 2013
- Hitachi, Ltd.
- Kenichi Tada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device and method of design of sem...
- Patent number 7,299,392
- Issue date Nov 20, 2007
- Hitachi, Ltd.
- Hisakazu Date
- G01 - MEASURING TESTING
Information Patent Grant
LSI logic circuit
- Patent number 4,862,068
- Issue date Aug 29, 1989
- Hitachi, Ltd.
- Masatoshi Kawashima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110204908
- Publication date Aug 25, 2011
- Hitachi, Ltd.
- Kenichi Tada
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device and method of design of sem...
- Publication number 20030094934
- Publication date May 22, 2003
- Hitachi, Ltd.
- Hisakazu Date
- G01 - MEASURING TESTING