Masatoshi KAWATAKE

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Patents Grantslast 30 patents

Information Patent Grant
Abnormality detection system, semiconductor device manufacturing sy...
- Patent number 10,409,260
- Issue date Sep 10, 2019
- Renesas Electronics Corporation
- Masatoshi Kawatake
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
ABNORMALITY DETECTION SYSTEM AND ABNORMALITY DETECTION PROGRAM
- Publication number 20200410363
- Publication date Dec 31, 2020
- RENESAS ELECTRONICS CORPORATION
- Masatoshi KAWATAKE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ABNORMALITY DETECTION SYSTEM, SEMICONDUCTOR DEVICE MANUFACTURING SY...
- Publication number 20190346820
- Publication date Nov 14, 2019
- RENESAS ELECTRONICS CORPORATION
- Masatoshi KAWATAKE
- G05 - CONTROLLING REGULATING
Information Patent Application
ABNORMALITY DETECTION SYSTEM, SEMICONDUCTOR DEVICE MANUFACTURING SY...
- Publication number 20180292806
- Publication date Oct 11, 2018
- RENESAS ELECTRONICS CORPORATION
- Masatoshi KAWATAKE
- G05 - CONTROLLING REGULATING