Masatoshi Kimachi

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Profilometer, measuring apparatus, and observing apparatus
- Patent number 8,717,578
- Issue date May 6, 2014
- Omron Corporation
- Yasuhiro Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Digital image processing and enhancing system and method with funct...
- Patent number 8,411,979
- Issue date Apr 2, 2013
- Omron Corporation
- Yuming Zhao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Object observing method and device
- Patent number 5,910,817
- Issue date Jun 8, 1999
- Omron Corporation
- Katsumi Ohashi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PROFILOMETER, MEASURING APPARATUS, AND OBSERVING APPARATUS
- Publication number 20120044504
- Publication date Feb 23, 2012
- Omron Corporation
- Yasuhiro Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL IMAGE PROCESSING AND ENHANCING SYSTEM AND METHOD WITH FUNCT...
- Publication number 20100303372
- Publication date Dec 2, 2010
- OMRON CORPORATION
- Yuming Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROFILOMETER
- Publication number 20100259746
- Publication date Oct 14, 2010
- Omron Corporation
- Yasuhiro Ohnishi
- G01 - MEASURING TESTING