Masatoshi Yasutake

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Particle measuring device and particle measuring method
- Patent number 11,143,606
- Issue date Oct 12, 2021
- HITACHI HIGH-TECH CORPORATION
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Sample for measuring particles, method for measuring particles and...
- Patent number 10,697,767
- Issue date Jun 30, 2020
- Hitachi High-Technologies Corporation
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring a magnetic field using a magneti...
- Patent number 5,623,205
- Issue date Apr 22, 1997
- Seiko Instruments Inc.
- Eisuke Tomita
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface analyzing and processing apparatus
- Patent number 5,440,122
- Issue date Aug 8, 1995
- Seiko Instruments Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 5,440,121
- Issue date Aug 8, 1995
- Seiko Instruments Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Alignment assembly for aligning a spring element with a laser beam...
- Patent number 5,423,514
- Issue date Jun 13, 1995
- Seiko Instruments Inc.
- Shigeru Wakiyama
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope having a directional coupler and a Z-dire...
- Patent number 5,324,935
- Issue date Jun 28, 1994
- Seiko Instruments Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Composite scanning tunneling microscope
- Patent number 5,142,145
- Issue date Aug 25, 1992
- Seiko Instruments, Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Composite scanning tunnelling microscope with a positioning function
- Patent number 5,117,110
- Issue date May 26, 1992
- Seiko Instruments, Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope
- Patent number 4,999,495
- Issue date Mar 12, 1991
- Seiko Instruments Inc.
- Chikara Miyata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for determining photo-chemical reaction heat
- Patent number 4,126,032
- Issue date Nov 21, 1978
- Kabushiki Kaisha Daini Seikosha
- Mitsuru Ikeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD
- Publication number 20200371050
- Publication date Nov 26, 2020
- Hitachi High-Tech Corporation
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE FOR MEASURING PARTICLES, METHOD FOR MEASURING PARTICLES AND...
- Publication number 20190178640
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Tomihiro HASHIZUME
- G01 - MEASURING TESTING

Masatoshi Yasutake

Person

Patents Grantslast 30 patents

Particle measuring device and particle measuring method

Sample for measuring particles, method for measuring particles and...

Method and apparatus for measuring a magnetic field using a magneti...

Surface analyzing and processing apparatus

Scanning probe microscope

Alignment assembly for aligning a spring element with a laser beam...

Scanning probe microscope having a directional coupler and a Z-dire...

Composite scanning tunneling microscope

Composite scanning tunnelling microscope with a positioning function

Scanning tunneling microscope

Method and apparatus for determining photo-chemical reaction heat

Patents Applicationslast 30 patents

PARTICLE MEASURING DEVICE AND PARTICLE MEASURING METHOD

SAMPLE FOR MEASURING PARTICLES, METHOD FOR MEASURING PARTICLES AND...