Masatsugu Yamashita

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Wako-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis method and analysis apparatus
- Patent number 7,977,116
- Issue date Jul 12, 2011
- Canon Kabushiki Kaisha
- Shintaro Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Detection method using electromagnetic wave and detection apparatus
- Patent number 7,542,140
- Issue date Jun 2, 2009
- Canon Kabushiki Kaisha
- Toshihiko Ouchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for diagnosing fault in semiconductor device
- Patent number 7,173,447
- Issue date Feb 6, 2007
- Riken
- Masatsugu Yamashita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20110216312
- Publication date Sep 8, 2011
- HAMAMATSU PHOTONICS K. K.
- Toru Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD USING ELECTROMAGNETIC WAVE AND DETECTION APPARATUS
- Publication number 20080137068
- Publication date Jun 12, 2008
- Canon Kabushiki Kaisha
- Toshihiko Ouchi
- G01 - MEASURING TESTING
Information Patent Application
Analysis method and analysis apparatus
- Publication number 20070229094
- Publication date Oct 4, 2007
- Riken
- Shintaro Kasai
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for diagnosing fault in semiconductor device
- Publication number 20060006886
- Publication date Jan 12, 2006
- Riken
- Masatsugu Yamashita
- G01 - MEASURING TESTING