Masaya KUDO

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Osaka-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Signal measurement unit
- Patent number 12,085,424
- Issue date Sep 10, 2024
- Omron Corporation
- Masaya Kudo
- G01 - MEASURING TESTING
Information Patent Grant
Counter unit, data processing device, measurement system, counter u...
- Patent number 11,988,529
- Issue date May 21, 2024
- Omron Corporation
- Masaya Kudo
- G01 - MEASURING TESTING
Information Patent Grant
Counter unit
- Patent number 11,640,197
- Issue date May 2, 2023
- Omron Corporation
- Hitoshi Oba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement processing device, measurement processing method, and p...
- Patent number 11,221,241
- Issue date Jan 11, 2022
- Omron Corporation
- Masaya Kudo
- G01 - MEASURING TESTING
Information Patent Grant
Analog signal input/output device and control method for analog sig...
- Patent number 10,791,596
- Issue date Sep 29, 2020
- Omron Corporation
- Masaya Kudo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COUNTER UNIT, DATA PROCESSING DEVICE, MEASUREMENT SYSTEM, COUNTER U...
- Publication number 20220196440
- Publication date Jun 23, 2022
- Omron Corporation
- Masaya KUDO
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL MEASUREMENT UNIT
- Publication number 20220196441
- Publication date Jun 23, 2022
- Omron Corporation
- Masaya KUDO
- G01 - MEASURING TESTING
Information Patent Application
COUNTER UNIT
- Publication number 20220121266
- Publication date Apr 21, 2022
- Omron Corporation
- Hitoshi OBA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALOG SIGNAL INPUT/OUTPUT DEVICE AND CONTROL METHOD FOR ANALOG SIG...
- Publication number 20200205257
- Publication date Jun 25, 2020
- Omron Corporation
- Masaya KUDO
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, AND P...
- Publication number 20200191624
- Publication date Jun 18, 2020
- Omron Corporation
- Masaya KUDO
- G01 - MEASURING TESTING