Masaya YAMAMOTO

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Patents Grantslast 30 patents

Information Patent Grant
Lighting optical system and substrate inspecting device
- Patent number 12,085,517
- Issue date Sep 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihiro Iwamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,044,627
- Issue date Jul 23, 2024
- HITACHI HIGH-TECH CORPORATION
- Masaya Yamamoto
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
DEFECT INSPECTION DEVICE
- Publication number 20240096667
- Publication date Mar 21, 2024
- Hitachi High-Tech Corporation
- Hiromichi YAMAKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lighting Optical System and Substrate Inspecting Device
- Publication number 20230142646
- Publication date May 11, 2023
- Hitachi High-Tech Corporation
- Akihiro IWAMATSU
- G01 - MEASURING TESTING
Information Patent Application
Sample Stage and Optical Inspection Device
- Publication number 20220373479
- Publication date Nov 24, 2022
- Hitachi High-Tech Corporation
- Masaya YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Defect Inspection Device and Defect Inspection Method
- Publication number 20220317058
- Publication date Oct 6, 2022
- Hitachi High-Tech Corporation
- Masaya YAMAMOTO
- G02 - OPTICS
Information Patent Application
CABLE CONNECTION WORK SUPPORT SYSTEM, CABLE CONNECTION WORK SUPPORT...
- Publication number 20220253806
- Publication date Aug 11, 2022
- NEC Corporation
- Masaya YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING