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Masayasu Fukunaga
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Yokohama, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor integrated circuit and method for testing the same
Patent number
7,872,490
Issue date
Jan 18, 2011
Fujitsu Semiconductor Limited
Masayasu Fukunaga
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Semiconductor integrated circuit and method for testing the same
Publication number
20100213970
Publication date
Aug 26, 2010
FUJITSU MICROELECTRONICS LIMITED
Masayasu Fukunaga
H03 - BASIC ELECTRONIC CIRCUITRY