Masayasu Fukunaga

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and method for testing the same
- Patent number 7,872,490
- Issue date Jan 18, 2011
- Fujitsu Semiconductor Limited
- Masayasu Fukunaga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit and method for testing the same
- Publication number 20100213970
- Publication date Aug 26, 2010
- FUJITSU MICROELECTRONICS LIMITED
- Masayasu Fukunaga
- H03 - BASIC ELECTRONIC CIRCUITRY