Masayasu Miyata

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Patents Applicationslast 30 patents

Information Patent Application
Detection and Reduction of Dielectric Breakdown in Semiconductor De...
- Publication number 20080211500
- Publication date Sep 4, 2008
- Jamil Tahir-Kheli
- G01 - MEASURING TESTING
Information Patent Application
Detection and reduction of dielectric breakdown in semiconductor de...
- Publication number 20050073678
- Publication date Apr 7, 2005
- Jamil Tahir-Kheli
- G01 - MEASURING TESTING