Masayasu NISHIZAWA

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device and inspection method
- Patent number 10,712,287
- Issue date Jul 14, 2020
- Lasertec Corporation
- Masayasu Nishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Detection method, inspection method, detection apparatus, and inspe...
- Patent number 10,539,511
- Issue date Jan 21, 2020
- Lasertec Corporation
- Masayasu Nishizawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
POSITION DETECTION APPARATUS, POSITION DETECTION METHOD AND NON-TRA...
- Publication number 20240074022
- Publication date Feb 29, 2024
- Lasertec Corporation
- Tsunehito KOHYAMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20190277772
- Publication date Sep 12, 2019
- Lasertec Corporation
- Masayasu NISHIZAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETECTION METHOD, INSPECTION METHOD, DETECTION APPARATUS, AND INSPE...
- Publication number 20190204235
- Publication date Jul 4, 2019
- Lasertec Corporation
- Masayasu NISHIZAWA
- G01 - MEASURING TESTING