Masayoshi Danbata

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of exposing a semiconductor wafer and exposure apparatus
- Patent number 8,558,990
- Issue date Oct 15, 2013
- Elpida Memory, Inc.
- Masayoshi Danbata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Semiconductor device evaluation method and apparatus using the same
- Patent number 7,495,457
- Issue date Feb 24, 2009
- Elpida Memory, Inc.
- Masayoshi Danbata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of exposing a semiconductor wafer and exposure apparatus
- Publication number 20110279798
- Publication date Nov 17, 2011
- Elpida Memory, Inc.
- Masayoshi Danbata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR DEVICE EVALUATION METHOD AND APPARATUS USING THE SAME
- Publication number 20080218193
- Publication date Sep 11, 2008
- Elpida Memory, Inc.
- Masayoshi Danbata
- G01 - MEASURING TESTING