Masayoshi Hirao

Person

Fukuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Input capacitance measurement circuit and method of manufacturing s...
- Patent number 11,774,476
- Issue date Oct 3, 2023
- Mitsubishi Electric Corporation
- Masayoshi Hirao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method for manufacturing same
- Patent number 10,665,670
- Issue date May 26, 2020
- Mitsubishi Electric Corporation
- Kazutoyo Takano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wiring core structure, semiconductor evaluation device and semicond...
- Patent number 10,224,388
- Issue date Mar 5, 2019
- Mitsubishi Electric Corporation
- Akira Okada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with semiconductor chip formed by using wide g...
- Patent number 7,057,298
- Issue date Jun 6, 2006
- Mitsubishi Denki Kabushiki Kaisha
- Masayoshi Hirao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with semiconductor chip formed by using wide g...
- Patent number 6,861,730
- Issue date Mar 1, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Masayoshi Hirao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with semiconductor chip formed by using wide g...
- Patent number 6,831,351
- Issue date Dec 14, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Masayoshi Hirao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card
- Patent number 6,788,082
- Issue date Sep 7, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Masayoshi Hirao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING DEVICE FOR CAPACITANCE OF SEMICONDUCTOR DEVICE AND MEASUR...
- Publication number 20250035689
- Publication date Jan 30, 2025
- Mitsubishi Electric Corporation
- Masayoshi HIRAO
- G01 - MEASURING TESTING
Information Patent Application
INPUT CAPACITANCE MEASUREMENT CIRCUIT AND METHOD OF MANUFACTURING S...
- Publication number 20230043250
- Publication date Feb 9, 2023
- Mitsubishi Electric Corporation
- Masayoshi HIRAO
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20190157389
- Publication date May 23, 2019
- Mitsubishi Electric Corporation
- Kazutoyo TAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIRING CORE STRUCTURE, SEMICONDUCTOR EVALUATION DEVICE AND SEMICOND...
- Publication number 20160054376
- Publication date Feb 25, 2016
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device with semiconductor chip formed by using wide g...
- Publication number 20050098876
- Publication date May 12, 2005
- Masayoshi Hirao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device with semiconductor chip formed by using wide g...
- Publication number 20040164403
- Publication date Aug 26, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Masayoshi Hirao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe card
- Publication number 20040036491
- Publication date Feb 26, 2004
- MITSUBISHI DENKI KABUSHIKI
- Masayoshi Hirao
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device with semiconductor chip formed by using wide g...
- Publication number 20030155644
- Publication date Aug 21, 2003
- MITSUBISHI DENKI KABUSHIKI
- Masayoshi Hirao
- H01 - BASIC ELECTRIC ELEMENTS

Masayoshi Hirao

Person

Patents Grantslast 30 patents

Input capacitance measurement circuit and method of manufacturing s...

Semiconductor device and method for manufacturing same

Wiring core structure, semiconductor evaluation device and semicond...

Semiconductor device with semiconductor chip formed by using wide g...

Semiconductor device with semiconductor chip formed by using wide g...

Semiconductor device with semiconductor chip formed by using wide g...

Probe card

Patents Applicationslast 30 patents

MEASURING DEVICE FOR CAPACITANCE OF SEMICONDUCTOR DEVICE AND MEASUR...

INPUT CAPACITANCE MEASUREMENT CIRCUIT AND METHOD OF MANUFACTURING S...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME

WIRING CORE STRUCTURE, SEMICONDUCTOR EVALUATION DEVICE AND SEMICOND...

Semiconductor device with semiconductor chip formed by using wide g...

Semiconductor device with semiconductor chip formed by using wide g...

Probe card

Semiconductor device with semiconductor chip formed by using wide g...