Masayoshi Seki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting optical modules
- Patent number 7,102,738
- Issue date Sep 5, 2006
- The Furukawa Electric Co., Ltd.
- Hiroyuki Matsuura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for inspecting optical modules
- Publication number 20040057039
- Publication date Mar 25, 2004
- THE FURUKAWA ELECTRIC CO., LTD.
- Hiroyuki Matsuura
- G01 - MEASURING TESTING