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Masayoshi Shinohara
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Calibration method for gas analysis apparatus, gas analysis system,...
Patent number
10,955,398
Issue date
Mar 23, 2021
Horiba, Ltd.
Naoto Mizutani
G01 - MEASURING TESTING
Information
Patent Grant
Exhaust gas analysis system and exhaust gas analysis program
Patent number
9,568,411
Issue date
Feb 14, 2017
Horiba, Ltd.
Ichiro Asano
G01 - MEASURING TESTING
Information
Patent Grant
Exhaust gas analysis system and exhaust gas analysis program
Patent number
9,188,506
Issue date
Nov 17, 2015
Horiba, Ltd.
Ichiro Asano
G01 - MEASURING TESTING
Information
Patent Grant
Particle number counting apparatus
Patent number
9,170,180
Issue date
Oct 27, 2015
Horiba, Ltd.
Masayoshi Shinohara
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring characteristics of critical orifice type consta...
Patent number
9,140,631
Issue date
Sep 22, 2015
Horiba, Ltd.
Yoshinori Otsuki
G01 - MEASURING TESTING
Information
Patent Grant
System for determining number of particles
Patent number
8,794,048
Issue date
Aug 5, 2014
Horiba, Ltd.
Takashi Matsuyama
G01 - MEASURING TESTING
Information
Patent Grant
Exhaust gas analyzing system
Patent number
8,528,424
Issue date
Sep 10, 2013
Horiba, Ltd.
Yoshinori Otsuki
G01 - MEASURING TESTING
Information
Patent Grant
Particulate matter measuring device
Patent number
8,387,447
Issue date
Mar 5, 2013
Horiba, Ltd.
Kazuo Hanada
G01 - MEASURING TESTING
Information
Patent Grant
Particulate matter analyzer, collecting filter and system for analy...
Patent number
8,012,231
Issue date
Sep 6, 2011
Horiba, Ltd.
Katsumi Saitoh
G01 - MEASURING TESTING
Information
Patent Grant
Particulate matter analyzer, collecting filter and system for analy...
Patent number
7,254,212
Issue date
Aug 7, 2007
Horiba, Ltd.
Katsumi Saitoh
G01 - MEASURING TESTING
Information
Patent Grant
Particulate matter concentration measuring apparatus
Patent number
7,159,446
Issue date
Jan 9, 2007
Horiba, Ltd.
Masayoshi Shinohara
G01 - MEASURING TESTING
Information
Patent Grant
Particulate matter concentration measuring apparatus
Patent number
6,964,190
Issue date
Nov 15, 2005
Horiba, Ltd.
Masayoshi Shinohara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CALIBRATION METHOD FOR GAS ANALYSIS APPARATUS, GAS ANALYSIS SYSTEM,...
Publication number
20190137465
Publication date
May 9, 2019
Horiba, Ltd.
Naoto MIZUTANI
G01 - MEASURING TESTING
Information
Patent Application
EXHAUST GAS ANALYSIS SYSTEM AND EXHAUST GAS ANALYSIS PROGRAM
Publication number
20160018309
Publication date
Jan 21, 2016
HORIBA, Ltd.
Ichiro Asano
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE NUMBER COUNTING APPARATUS
Publication number
20130180321
Publication date
Jul 18, 2013
Horiba, Ltd.
Masayoshi Shinohara
G01 - MEASURING TESTING
Information
Patent Application
EXHAUST GAS ANALYSIS SYSTEM AND EXHAUST GAS ANALYSIS PROGRAM
Publication number
20130174641
Publication date
Jul 11, 2013
HORIBA, LTD.
Ichiro Asano
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MEASURING CHARACTERISTICS OF CRITICAL ORIFICE TYPE CONSTA...
Publication number
20120174989
Publication date
Jul 12, 2012
Horiba, Ltd.
Yoshinori OTSUKI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR DETERMINING NUMBER OF PARTICLES
Publication number
20120090377
Publication date
Apr 19, 2012
Horiba, Ltd.
Takashi Matsuyama
G01 - MEASURING TESTING
Information
Patent Application
EXHAUST GAS ANALYZING SYSTEM
Publication number
20120017666
Publication date
Jan 26, 2012
Horiba, Ltd.
Yoshinori Otsuki
G01 - MEASURING TESTING
Information
Patent Application
PARTICULATE MATTER MEASURING DEVICE
Publication number
20110192145
Publication date
Aug 11, 2011
Horiba, Ltd.
Kazuo Hanada
G01 - MEASURING TESTING
Information
Patent Application
PARTICULATE MATTER ANALYZER, COLLECTING FILTER AND SYSTEM FOR ANALY...
Publication number
20070277626
Publication date
Dec 6, 2007
Katsumi Saitoh
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Particulate matter analyzer, collecting filter and system for analy...
Publication number
20050041774
Publication date
Feb 24, 2005
Katsumi Saitoh
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Particulate matter concentration measuring apparatus
Publication number
20040055362
Publication date
Mar 25, 2004
Masayoshi Shinohara
G01 - MEASURING TESTING