Masayoshi Shirakawa

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Akiruno, JP

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Patents Grantslast 30 patents

Information Patent Grant
Testing device for testing a semiconductor device
- Patent number 8,159,250
- Issue date Apr 17, 2012
- Fujitsu Semiconductor Limited
- Yuji Maruyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING DEVICE OF SEMICONDUCTOR DEVICE
- Publication number 20090267630
- Publication date Oct 29, 2009
- Fujitsu Microelectronics Limited
- Yuji Maruyama
- G01 - MEASURING TESTING