Masayoshi Takeda

Person

Mito, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus
- Patent number 7,599,054
- Issue date Oct 6, 2009
- Hitachi High-Technologies Corporation
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Circuit-pattern inspecting apparatus and method
- Patent number 7,423,746
- Issue date Sep 9, 2008
- Hitachi High-Technologies Corporation
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 7,355,693
- Issue date Apr 8, 2008
- Hitachi High-Technologies Corporation
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 7,348,558
- Issue date Mar 25, 2008
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 7,030,394
- Issue date Apr 18, 2006
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 6,825,480
- Issue date Nov 30, 2004
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT-PATTERN INSPECTING APPARATUS AND METHOD
- Publication number 20080317330
- Publication date Dec 25, 2008
- Hitachi High-Technologies Corporation
- Masayoshi TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection apparatus
- Publication number 20080162065
- Publication date Jul 3, 2008
- HITACHI HIGH-TECNOLOGIES CORPORATION
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Application
Circuit-pattern inspecting apparatus and method
- Publication number 20070201018
- Publication date Aug 30, 2007
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Publication number 20060289751
- Publication date Dec 28, 2006
- Hitachi, Ltd
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Focus correction method for inspection of circuit patterns
- Publication number 20060284088
- Publication date Dec 21, 2006
- Fumihiko Fukunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern inspection apparatus
- Publication number 20060133661
- Publication date Jun 22, 2006
- Hitachi High-Technologies Corporation
- Masayoshi Takeda
- G01 - MEASURING TESTING
Information Patent Application
Charged-particle beam apparatus and method for automatically correc...
- Publication number 20060060781
- Publication date Mar 23, 2006
- Masahiro Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Application
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Publication number 20050092930
- Publication date May 5, 2005
- Hitachi, Ltd. Incorporation
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Charged-particle beam apparatus and method for automatically correc...
- Publication number 20030006371
- Publication date Jan 9, 2003
- Masahiro Watanabe
- H01 - BASIC ELECTRIC ELEMENTS

Masayoshi Takeda

Person

Patents Grantslast 30 patents

Pattern inspection apparatus

Circuit-pattern inspecting apparatus and method

Pattern inspection apparatus

Charged particle beam apparatus and automatic astigmatism adjustmen...

Charged particle beam apparatus and automatic astigmatism adjustmen...

Charged particle beam apparatus and automatic astigmatism adjustmen...

Patents Applicationslast 30 patents

CIRCUIT-PATTERN INSPECTING APPARATUS AND METHOD

Pattern inspection apparatus

Circuit-pattern inspecting apparatus and method

Charged particle beam apparatus and automatic astigmatism adjustmen...

Focus correction method for inspection of circuit patterns

Pattern inspection apparatus

Charged-particle beam apparatus and method for automatically correc...

Charged particle beam apparatus and automatic astigmatism adjustmen...

Charged-particle beam apparatus and method for automatically correc...