Masayoshi Tonouchi

Person

Mino-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus and inspection method
- Patent number 10,158,325
- Issue date Dec 18, 2018
- SCREEN Holdings Co., Ltd.
- Hidetoshi Nakanishi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Modification processing device, modification monitoring device and...
- Patent number 10,001,441
- Issue date Jun 19, 2018
- SCREEN Holdings Co., Ltd.
- Hidetoshi Nakanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photo device inspection apparatus and photo device inspection method
- Patent number 9,651,607
- Issue date May 16, 2017
- SCREEN Holdings Co., Ltd.
- Hidetoshi Nakanishi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Inspecting device and inspecting method
- Patent number 9,541,508
- Issue date Jan 10, 2017
- SCREEN Holdings Co., Ltd.
- Hidetoshi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 9,450,536
- Issue date Sep 20, 2016
- SCREEN Holdings Co., Ltd.
- Hidetoshi Nakanishi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 9,404,874
- Issue date Aug 2, 2016
- SCREEN HOLDINGS, CO., LTD.
- Hidetoshi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 9,383,321
- Issue date Jul 5, 2016
- SCREEN Holdings Co., Ltd.
- Hidetoshi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting device and inspecting method
- Patent number 9,234,934
- Issue date Jan 12, 2016
- SCREEN Holdings Co., Ltd.
- Hidetoshi Nakanishi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Inspecting device and inspecting method
- Patent number 9,151,669
- Issue date Oct 6, 2015
- SCREEN Holdings Co., Ltd.
- Akira Ito
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 9,103,870
- Issue date Aug 11, 2015
- SCREEN Holdings Co., Ltd.
- Hidetoshi Nakanishi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor inspection method and semiconductor inspection apparatus
- Patent number 8,941,824
- Issue date Jan 27, 2015
- Dainippon Screen Mfg. Co., Ltd.
- Hidetoshi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,872,114
- Issue date Oct 28, 2014
- Dainippon Screen Mfg. Co., Ltd.
- Hidetoshi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic radiation generating element, electromagnetic radia...
- Patent number 8,530,868
- Issue date Sep 10, 2013
- Dainippon Screen Mfg. Co., Ltd.
- Hidetoshi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Electric-field distribution measurement method and apparatus for se...
- Patent number 7,466,151
- Issue date Dec 16, 2008
- Aisin Seiki Kabushiki Kaisha
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for diagnosing fault in semiconductor device
- Patent number 7,173,447
- Issue date Feb 6, 2007
- Riken
- Masatsugu Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting wire breaking of integrated cir...
- Patent number 6,980,010
- Issue date Dec 27, 2005
- Riken
- Masayoshi Tonouchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MODIFICATION PROCESSING DEVICE, MODIFICATION MONITORING DEVICE AND...
- Publication number 20160093539
- Publication date Mar 31, 2016
- SCREEN Holdings Co., Ltd.
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20150276607
- Publication date Oct 1, 2015
- SCREEN Holdings Co., Ltd.
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20150236642
- Publication date Aug 20, 2015
- SCREEN Holdings Co., Ltd.
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPRATUS AND INSPECTION METHOD
- Publication number 20150162872
- Publication date Jun 11, 2015
- SCREEN HOLDINGS CO., LTD.
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20150053869
- Publication date Feb 26, 2015
- DAINIPPON SCREEN MFG. CO., LTD.
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
PHOTO DEVICE INSPECTION APPARATUS AND PHOTO DEVICE INSPECTION METHOD
- Publication number 20150015297
- Publication date Jan 15, 2015
- DAINIPPON SCREEN MFG. CO., LTD.
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING DEVICE AND INSPECTING METHOD
- Publication number 20140253911
- Publication date Sep 11, 2014
- OSAKA UNIVERSITY
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING DEVICE AND INSPECTING METHOD
- Publication number 20140239182
- Publication date Aug 28, 2014
- OSAKA UNIVERSITY
- Akira ITO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING DEVICE AND INSPECTING METHOD
- Publication number 20140002125
- Publication date Jan 2, 2014
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20130222004
- Publication date Aug 29, 2013
- OSAKA UNIVERSITY
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC RADIATION GENERATING ELEMENT, ELECTROMAGNETIC RADIA...
- Publication number 20130153793
- Publication date Jun 20, 2013
- OSAKA UNIVERSITY
- Hidetoshi NAKANISHI
- G02 - OPTICS
Information Patent Application
SEMICONDUCTOR INSPECTION METHOD AND SEMICONDUCTOR INSPECTION APPARATUS
- Publication number 20130083319
- Publication date Apr 4, 2013
- OSAKA UNIVERSITY
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20130015368
- Publication date Jan 17, 2013
- DAINIPPON SCREEN MFG. CO., LTD/OASAKA UNIVERSITY
- Hidetoshi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20110216312
- Publication date Sep 8, 2011
- HAMAMATSU PHOTONICS K. K.
- Toru Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Method and device for measuring electric field distribution of semi...
- Publication number 20070018634
- Publication date Jan 25, 2007
- Hideyuki Ohtake
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for diagnosing fault in semiconductor device
- Publication number 20060006886
- Publication date Jan 12, 2006
- Riken
- Masatsugu Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting wire breaking of integrated cir...
- Publication number 20040246011
- Publication date Dec 9, 2004
- Riken
- Masayoshi Tonouchi
- G01 - MEASURING TESTING

Masayoshi Tonouchi

Person

Patents Grantslast 30 patents

Inspection apparatus and inspection method

Modification processing device, modification monitoring device and...

Photo device inspection apparatus and photo device inspection method

Inspecting device and inspecting method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Inspecting device and inspecting method

Inspecting device and inspecting method

Inspection apparatus and inspection method

Semiconductor inspection method and semiconductor inspection apparatus

Inspection apparatus and inspection method

Electromagnetic radiation generating element, electromagnetic radia...

Electric-field distribution measurement method and apparatus for se...

Method and apparatus for diagnosing fault in semiconductor device

Method and apparatus for inspecting wire breaking of integrated cir...

Patents Applicationslast 30 patents

MODIFICATION PROCESSING DEVICE, MODIFICATION MONITORING DEVICE AND...

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

INSPECTION APPRATUS AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

PHOTO DEVICE INSPECTION APPARATUS AND PHOTO DEVICE INSPECTION METHOD

INSPECTING DEVICE AND INSPECTING METHOD

INSPECTING DEVICE AND INSPECTING METHOD

INSPECTING DEVICE AND INSPECTING METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

ELECTROMAGNETIC RADIATION GENERATING ELEMENT, ELECTROMAGNETIC RADIA...

SEMICONDUCTOR INSPECTION METHOD AND SEMICONDUCTOR INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD

Method and device for measuring electric field distribution of semi...

Method and apparatus for diagnosing fault in semiconductor device

Method and apparatus for inspecting wire breaking of integrated cir...